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Hybrid Phototransistors Based on Bulk Heterojunction Films of Poly(3-hexylthiophene) and Zinc Oxide Nanoparticle

机译:基于聚(3-己基噻吩)和氧化锌纳米粒子的异质结薄膜的混合光电晶体管

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摘要

Hybrid phototransistors (HPTRs) were fabricated on glass substrates using organic/inorganic hybrid bulk heterojunction films of p-type poly(3-hexylthiophene) (P3HT) and n-type zinc oxide nanoparticles (ZnO_(NP)). The content of ZnO_(NP) was varied up to SO wt % in order to understand the composition effect of ZnO_(NP) on the performance of HPTRs. The morphology and nanostructure of the P3HT:ZnO_(NP) films was examined by employing high resolution electron microscopes and synchrotron radiation grazing angle X-ray diffraction system. The incident light intensity (P_(IN)) was varied up to 43.6 μW/cm~2, whereas three major wavelengths (525 nm, 555 nm, 605 nm) corresponded to the optical absorption of P3HT were applied. Results showed that the present HPTRs showed typical p-type transistor performance even though the n-type ZnO_(NP) content increased up to 50 wt %. The highest transistor performance was obtained at 50 wt %, whereas the lowest performance was measured at 23 wt % because of the immature bulk heterojunction morphology. The drain current (I_D) was proportionally increased with P_(IN) due to the photocurrent generation in addition to the field-effect current. The highest apparent and corrected responsivities (R_A = 4.7 A/W and Re = 2.07 A/W) were achieved for the HPTR with the P3HT:ZnO_(NP) film (50 wt % ZnO_(NP)) at P_(IN) = 0.27 μW/cm~2 (555 nm).
机译:使用p型聚(3-己基噻吩)(P3HT)和n型氧化锌纳米粒子(ZnO_(NP))的有机/无机杂化体异质结薄膜在玻璃基板上制备了杂化光电晶体管(HPTR)。为了了解ZnO_(NP)的组成对HPTRs性能的影响,ZnO_(NP)的含量变化至SO wt%。采用高分辨率电子显微镜和同步辐射辐射掠角X射线衍射系统对P3HT:ZnO_(NP)薄膜的形貌和纳米结构进行了研究。入射光强度(P_(IN))变化高达43.6μW/ cm〜2,而施加了与P3HT的光吸收相对应的三个主要波长(525 nm,555 nm,605 nm)。结果表明,即使n型ZnO_(NP)含量增加到50 wt%,当前的HPTR仍显示出典型的p型晶体管性能。由于未成熟的本体异质结形态,在50wt%下获得最高的晶体管性能,而在23wt%下测量出最低的性能。除了场效应电流外,由于产生光电流,漏极电流(I_D)与P_(IN)成比例地增加。使用P3HT:ZnO_(NP)膜(50 wt%ZnO_(NP))在P_(IN)=时,HPTR的表观和校正响应率最高(R_A = 4.7 A / W和Re = 2.07 A / W) 0.27μW/ cm〜2(555 nm)。

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