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首页> 外文期刊>ACS applied materials & interfaces >Low-Temperature Metal-Oxide Thin-Film Transistors Formed by Directly Photopatternable and Combustible Solution Synthesis
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Low-Temperature Metal-Oxide Thin-Film Transistors Formed by Directly Photopatternable and Combustible Solution Synthesis

机译:通过直接光可构图和可燃溶液合成形成的低温金属氧化物薄膜晶体管

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摘要

We investigated the formation of ultraviolet (UV)-assisted directly patternable solution-processed oxide semiconductor films and successfully fabricated thin-film transistors (TFTs) based on these films. An InGaZnO (IGZO) solution that was modified chemically with benzoylacetone (BzAc), whose chelate rings decomposed via a π—π* transition as result of UV irradiation, was used for the direct patterning. A TFT was fabricated using the directly patterned IGZO film, and it had better electrical characteristics than those of conventional photoresist (PR)-patterned TFTs. In addition, the nitric acid (HNO3) and acetylacetone (AcAc) modified In2O3 (NAc-In2O3) solution exhibited both strong UV absorption and high exothermic reaction. This method not only resulted in the formation of a low-energy path because of the combustion of the chemically modified metal-oxide solution but also allowed for photoreaction-induced direct patterning at low temperatures.
机译:我们研究了紫外线(UV)辅助的可直接图案化溶液处理的氧化物半导体膜的形成,并成功地基于这些膜制造了薄膜晶体管(TFT)。直接图案化使用了经过苯甲酰丙酮(BzAc)化学修饰的InGaZnO(IGZO)溶液,该螯合物的螯合环通过π-π*跃迁分解。使用直接构图的IGZO膜制造了TFT,它具有比常规光刻胶(PR)构图的TFT更好的电特性。此外,硝酸(HNO3)和乙酰丙酮(AcAc)改性的In2O3(NAc-In2O3)溶液显示出强紫外线吸收和高放热反应。该方法不仅由于化学改性的金属氧化物溶液的燃烧而导致形成低能量路径,而且还允许在低温下进行光反应诱导的直接图案化。

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