Logic BIST accelerator (LBA): a key device for at-speed testing of large system-on-chips

摘要

A logic BIST accelerator (LBA) enables at-speed testing of large and high-speed system-on-chips by overcoming timing problems during test. It is based on a flexible clock control circuit, a two-phase-clocked BIST controller, and new physical design strategy. It was confirmed that the LBA improves testing speed on a 5.8-million-transistor system-on-chip.