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首页> 外文期刊>Journal of trace and microprobe techniques >Dead Time Based Correction for the Combined Electronic Losses in INAA Based on Short-Lived Radionuclides
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Dead Time Based Correction for the Combined Electronic Losses in INAA Based on Short-Lived Radionuclides

机译:基于短寿命放射性核素的inaa中综合电子损失的死区校正

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摘要

The combined negative bias in gamma-spectrometry due to pile-up and (residual) dead time losses in case of short-lived radionuclides can be corrected for by way of dead time readings. The combined loss-factor depends on the ratio of the time-constants in amplifier and ADC, and on the average decay-constant over the total spectrum during measurement. Both parameters can be determined once and for all for a given routine application. The procedure is applicable up to total dead time fractions of at least 0.3 and thus covers routine instrumental neutron activation analysis (INAA) practice with short-lived radionuclides.
机译:由于死亡时间读数,在短寿命的放射性核素的情况下,γ光谱法的组合负偏压和(残留的)死区时间损失可以通过死区时间读取来校正。 组合损失因子取决于放大器和ADC中的时间常数的比率,以及在测量期间的总光谱上的平均衰减常数。 可以为给定的例程应用程序确定一次和所有参数。 该程序适用于总死区段至少为0.3,因此涵盖具有短寿命的放射性核素的常规仪器中子激活分析(INAA)实践。

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