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Using Karnaugh Maps in Software Requirements Analysis

机译:在软件需求分析中使用Karnaugh地图

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Faulty requirements leading to design deficiencies have been shown to be an avoidable root cause of many product failures. This paper is an effort to push the boundaries of system safety by proposing a novel approach for discovering faulty or missing software requirements by adapting a proven methodology heretofore used in circuit analysis. Karnaugh Mapping is employed in Application-Specific Integrated Circuit (ASIC) design to minimize power consumption, facilitate temperature control, increase functionality and minimize the number of physical logic gates. Karnaugh Maps (K-Maps) are ideally suited to impose order on logical requirements that describe the operation of electronic circuits. With the assumption that software requirements are expressible as logical statements, this paper assesses the ability of Karnaugh Mapping to effectively deconstruct and rationalize developmental requirements in the analysis of software and seeks to demonstrate that K-Maps can be used not only to minimize the number of requirements, but also to detect missing requirements. The analysis conducted in the course of developing this paper indicates that K-Maps can effectively identify faulty requirements in two examples of varying complexity, provided that sematic conventions are established and observed.
机译:导致设计缺陷的错误要求已被证明是许多产品故障的可避免根本原因。本文努力通过提出通过调整电路分析的经过验证的方法来发现有故障或缺少软件要求的新方法来推动系统安全的界限。 Karnaugh Mapping采用特定于应用专用集成电路(ASIC)设计,以最大限度地减少功耗,促进温度控制,增加功能并最小化物理逻辑门的数量。 Karnaugh地图(K-MAPS)非常适合施加描述描述电子电路操作的逻辑要求的订单。本文认为软件要求是逻辑陈述的表现,评估了卡诺映射能力,以有效解构和合理化发展要求,并旨在证明k地图不仅可以最小化最小化k图要求,但也可以检测缺失的要求。本文在开发过程中进行的分析表明,只要建立并观察到了语法约定,k映射可以有效地识别两个不同复杂性的例子中的错误要求。

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