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Using Karnaugh Maps in Software Requirements Analysis

机译:在软件需求分析中使用Karnaugh地图

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Faulty requirements leading to design deficiencies have been shown to be an avoidable root cause of many product failures. Reflecting the theme of the 2017 International System Safety Society Conference, this paper is an effort to push the boundaries of system safety by proposing a novel approach for discovering faulty or missing software requirements by adapting a proven methodology heretofore used in circuit analysis. Karnaugh Mapping is employed in Application Specific Integrated Circuit (ASIC) design to minimize power consumption, facilitate temperature control, increase functionality, and minimize the number of physical logic gates. Karnaugh Maps (K-Maps) are ideally suited to impose order on logical requirements that describe the operation of electronic circuits. With the assumption that software requirements are expressible as logical statements, this paper assesses the ability of Karnaugh Mapping to effectively deconstruct and rationalize developmental requirements in the analysis of software, and seeks to demonstrate that K-Maps can be used not only to minimize the number of requirements but also to detect missing requirements. The analysis conducted in the course of developing this paper indicates that K-Maps can effectively identify faulty requirements in two examples of varying complexity providing that sematic conventions are established and observed.
机译:故障要求导致设计的不足已被证明是许多产品故障可避免的根本原因。反映了2017年国际系统安全协会会议的主题,本文主要是通过提出用于发现故障或通过采用在电路分析迄今使用经过验证的方法缺少的软件需求的新途径,推动系统安全边界的工作。卡诺映射被用在特定用途集成电路(ASIC)的设计,以使功耗最小化,便于恒温控制,增加的功能性,并最小化的物理逻辑门的数量。卡诺图(K-地图)非常适合于在该描述的电子电路的操作的逻辑要求强加次序。在假设软件需求可表达为逻辑语句,本文评估了卡诺图的有效解构和软件的分析合理化发展要求的能力,并试图证明K-地图不仅可以用来减少数量的要求,而且还检测丢失的要求。在开发本文的过程中进行的分析表明,K-地图可以有效地识别以不同复杂性提供思迈特约定建立和观察到的两个例子有故障的要求。

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