An environment to perform functional tests on boards and integrated circuits

摘要

This paper addresses the issue of providing an environment (software and hardware) to perform functional tests on printed circuit boards, using the IEEE 1149.1 standard, and also on integrated circuits using scan design like the LSSD testing methodology. This paper also discusses some approaches and presents some options to tackle the problem of performing board and chip functional tests, using a common hardware platform. The main issues of the software environment are discussed and presented, together with an overview of the hardware architecture.