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Direct Measurement of Electric Resistivity of Solid Electrolyte Interface Using 4-Point-Probe Technique

机译:使用4点探针技术直接测量固体电解质界面的电阻率

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Lack of understanding on the electrical properties of the solid electrolyte interface (SEI) has been one of the major hurdles for developing fast charging Li-ion batteries. Here, we report our preliminary experimental result on the measurement of the electrical resistivity of SEI using the direct-contact technique based on electron microscopy combined with 4-point-probe micro-electrical method. We observed that the SEI layer, which covers uniformly the surface of the graphite anode, exhibits a high resistivity (2.3 x 10(5) Omega.m) comparable to those of typical insulators. In this study, using first principles calculations performed on the computational LixF1-x (0.25 x 0.75) phases, we elucidate the structural origin responsible for the measured resistivity of SEI by analyzing the electronic structures.
机译:对固体电解质界面(SEI)的电气性质缺乏了解是开发快速充电锂离子电池的主要障碍之一。 在这里,我们通过基于电子显微镜的直接接触技术与4点探针微电路方法相结合的直接接触技术来报告我们对SEI电阻率测量的初步实验结果。 我们观察到均匀地覆盖石墨阳极表面的SEI层表现出与典型绝缘体的高电阻率(2.3×10(5)Ω.m)。 在该研究中,使用在计算LiXF1-X(0.25×X< 0.75)相对上进行的第一个原理计算,通过分析电子结构,阐明负责SEI电阻率的结构来源。

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