Improving Reliability of Physically Unclonable Function Using Error Correcting Code

摘要

Physically Unclonable Function (PUF) is a promising solution to satisfy hardware security demands. Several structures have been proposed to generate a unique and unclonable key from a silicon chip. Delay-based and Memory-based PUFs are the most popular FPGA implementation of a PUF construction. In this study we implement Anderson PUF, RO PUF and SR Latch PUF on several FPGA platforms and perform an analysis on their performance metrics such as Reliability, Uniqueness and Bit-aliasing. Changes in temperature and supply voltage can affect reliability of PUF. Since a noiseless key is required in applications such as secret key generation, a new Error Correcting Code (ECC) is presented to address this issue.