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EARLY DETECTION OF RELIABILITY DEGRADATION THROUGH ANALYSIS OF MULTIPLE PHYSICALLY UNCLONABLE FUNCTION CIRCUIT CODES

机译:通过对多个物理不可克隆的功能电路代码的分析,对可靠性退化进行早期检测

摘要

An apparatus is described that includes a plurality of circuits each designed to exhibit a unique signature code that is determined from manufacturing tolerances associated with a manufacturing process used to manufacture the circuits. The apparatus also includes error circuitry to determine an error has arisen based on a change in signature codes from the plurality of circuits.
机译:描述了一种装置,该装置包括多个电路,每个电路被设计为展现唯一的签名代码,该签名代码由与用于制造电路的制造过程相关的制造公差确定。该设备还包括错误电路,该错误电路基于来自多个电路的签名代码的变化来确定已经发生的错误。

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