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EARLY DETECTION OF RELIABILITY DEGRADATION THROUGH ANALYSIS OF MULTIPLE PHYSICALLY UNCLONABLE FUNCTION CIRCUIT CODES
EARLY DETECTION OF RELIABILITY DEGRADATION THROUGH ANALYSIS OF MULTIPLE PHYSICALLY UNCLONABLE FUNCTION CIRCUIT CODES
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机译:通过对多个物理不可克隆的功能电路代码的分析,对可靠性退化进行早期检测
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摘要
An apparatus is described that includes a plurality of circuits each designed to exhibit a unique signature code that is determined from manufacturing tolerances associated with a manufacturing process used to manufacture the circuits. The apparatus also includes error circuitry to determine an error has arisen based on a change in signature codes from the plurality of circuits.
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