Nanoscale Analysis of Corrosion Products: A Review of the Application of Atom Probe and Complementary Microscopy Techniques

摘要

Atom probe tomography has developed into a technique that can provide atomic-scale three-dimensional information pertaining to corrosion products, with excellent chemical resolution. Like for most characterization techniques, use of atom probe tomography for analysis of corrosion products is not without its challenges. In the short time that this technique has been utilized for corrosion studies, complementary microscopy techniques have been extremely useful for production and analysis of oxide-containing atom probe samples. We review herein how correlative microscopy techniques such as electron microscopy, microanalysis techniques, and transmission Kikuchi diffraction have been utilized to overcome challenges associated with atom probe microscopy, including how information from correlative microscopy can be applied to inform three-dimensional reconstruction of atom probe data.