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Correlation of acetylene plasma discharge environment and the optical and electronic properties of the hydrogenated amorphous carbon films

机译:乙炔等离子体放电环境与氢化非晶碳膜的光学和电子性质的相关性

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摘要

Thin films from polymeric and graphitic hydrogenated amorphous carbon (a-C:H) were deposited over a glass substrate from acetylene (C2H2) plasma by using a conventional plasma enhanced chemical vapor deposition (PECVD). Radio frequency capacitively coupled plasma (RF CCP) source operating at a frequency of 13.56 MHz was used for generation of the discharge. Optical emission spectroscopy (OES) results showed strong optical emissions from diacetylene ion C4H2+ at a wavelength of 506 nm. The energy dispersive X-ray (EDS) measurements illustrated that the carbon content in the deposited films increased with increasing of power. The Raman and IR results demonstrated that the films deposited at low bias voltages 340 V are so called polymeric a-C:H with high sp(3) fraction and high hydrogen content, while the films deposited at high bias voltages 877 V are so called graphitic a-C:H with low sp(3) fraction and low hydrogen content. Quantitative information were obtained from fitting the high asymmetrical vibrational modes of Raman and IR spectra by using Fano model expression together with Lorentzian function. The results presented here point out that there is a relation between the intensity of C4H2+ ion emissions and the deposited films properties.
机译:通过使用常规的等离子体增强的化学气相沉积(PECVD),通过乙炔(C2H2)血浆沉积来自聚合物和石墨氢化非晶碳(A-C:H)的薄膜。以13.56MHz的频率操作的射频电容耦合等离子体(RF CCP)源用于产生放电。光发射光谱(OES)结果显示出在506nm波长的二乙炔离子C4H2 +的强光学发射。能量分散X射线(EDS)测量说明沉积膜中的碳含量随着功率的增加而增加。拉曼和IR结果表明,在低偏置电压340V下沉积的薄膜被称为聚合物AC:H,具有高SP(3)级分和高氢含量,而在高偏置电压877V下沉积的薄膜被称为石墨AC :H具有低SP(3)分数和低氢含量。通过使用Fano模型表达与Lorentzian功能一起拟合RAMAN和IR光谱的高不对称振动模式来获得定量信息。这里提出的结果指出,C4H2 +离子排放的强度与沉积的薄膜性能之间存在关系。

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