机译:半导体制造业聚合物零件中的杂质检测
226176 CTR Carinthian Tech Research AG Europastrasse 12 9524 Villach Austria;
226176 CTR Carinthian Tech Research AG Europastrasse 12 9524 Villach Austria;
226176 CTR Carinthian Tech Research AG Europastrasse 12 9524 Villach Austria;
Meislitzer Pr?zisionstechnik GmbH Haiderbach 11 9563 Haiderbach Austria;
226176 CTR Carinthian Tech Research AG Europastrasse 12 9524 Villach Austria;
226176 CTR Carinthian Tech Research AG Europastrasse 12 9524 Villach Austria;
226176 CTR Carinthian Tech Research AG Europastrasse 12 9524 Villach Austria;
226176 CTR Carinthian Tech Research AG Europastrasse 12 9524 Villach Austria;
497048 Lam Research AG Austria SEZ-Strasse 1 9500 Villach Austria;
497048 Lam Research AG Austria SEZ-Strasse 1 9500 Villach Austria;
226178 PCCL Polymer Competence Center Leoben Roseggerstrasse 12 8700 Leoben Austria;
226178 PCCL Polymer Competence Center Leoben Roseggerstrasse 12 8700 Leoben Austria;
343029 OFI Technologie &
Innovation GmbH Franz-Grill-Stra?e 5 1030 Wien Austria;
226176 CTR Carinthian Tech Research AG Europastrasse 12 9524 Villach Austria;
226176 CTR Carinthian Tech Research AG Europastrasse 12 9524 Villach Austria;
Non-destructive testing; high quality polymer parts; tomography;
机译:半导体制造业聚合物零件中的杂质检测
机译:大块半导体中磁性杂质相互作用的原子尺度检测
机译:荧光XAFS检测半导体中杂质浓度的最低限度:共振拉曼散射和角度依赖性
机译:半导体制造业中使用的高质量聚合物中的缺陷检测
机译:硅革命:半导体制造业的可持续性披露和绩效(2010-2014年)。
机译:化学用途和相关的健康问题在半导体制造业
机译:玻璃硫族化物半导体中辐射诱导的亚稳态的起源:本征和杂质相关的破坏-聚合转化的作用
机译:半导体测量技术:半导体工业中材料,加工和制造的光学表征方法综述