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Toward an accurate quantification in atom probe tomography reconstruction by correlative electron tomography approach on nanoporous materials

机译:通过纳米多孔材料的相关电子断层扫描方法对原子探测断层扫描重建进行准确定量

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Highlights?Nanoporous materials atom probe tomography analysis.?Correlative atom probe tomography and electron microscopy.?Calibration of the atom probe tomography reconstruction parameters.AbstractIn this contribution, we propose a protocol for analysis and accurate reconstruction of nanoporous materials by atom probe tomography (APT). The existence of several holes in porous materials makes both the direct APT analysis and reconstruction almost inaccessible. In the past, a solution has been proposed by filling pores with electron beam-induced deposition. Here, we present an alternative solution using an electro-chemical method allowing to fill even small and dense pores, making APT analysis possible. Concerning the 3D reconstruction, the microstructural features observed by electron tomography are used to finely calibrate the APT reconstruction parameters.]]>
机译:<![cdata [ 突出显示 纳米孔材料原子探测断层扫描分析。 相关原子探测断层扫描和电子显微镜。 原子探测断层扫描重建参数的校准。 抽象 < CE:Abstract-SEC ID =“ABSS0002”View =“全部”> 在本贡献中,我们提出了一种分析和准确地重建纳米多孔材料的协议原子探测断层扫描(APT)。多孔材料中的几个孔的存在使得直接的APT分析和重建几乎无法进入。过去,通过用电子束诱导的沉积填充孔来提出一种解决方案。这里,我们使用电化学方法呈现替代解决方案,允许填充甚至小和密集的孔,使得APT分析成为可能。关于3D重建,电子断层扫描观察到的微观结构特征用于精细校准APT重建参数。 ]]>

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