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Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting

召开年：2012
召开地：Phoenix, AZ(US)
出版时间：-

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1.Measuring the Three-Dimensional Shape of Grain Boundary Precipitates Using KSpaceNavigator

机译：使用KSpaceNavigator测量晶粒边界沉淀的三维形状
- 作者：A. Gautam; T. Duden; S. Hagège; C. Ophus; U. Dahmen
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
2.ATUM-based SEM for High-Speed Large-Volume Biological Reconstructions ??

机译：基于ATUM的SEM用于高速大体积生物重建
- 作者：R. Schalek; K. Hayworth; N. Kasthuri; J.L. Morgan; D Berger; A.M. Wilson; P. Anger; D. A derhold; H.S. Seung; J.W. Lichtman
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
3.Polymer Inclusions in Biomimetic Calcite

机译：仿生方解石中的聚合物包裹体
- 作者：H. Friedrich; J.P. dos Santos Bastos; Z. Deng; G. J. M. Habraken; D.A.M. de Winter; N.Lousberg; J.A. Post; G. de With; N. A. J. M. Sommerdijk
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
4.Advances in High-Resolution X-Ray Computed Tomography: Comparing the Latest in Cabinet-based Micro-Computed Tomography Technologies and Synchrotron Radiation-Based Tomography Beamlines

机译：高分辨率X射线计算机断层扫描技术的进展：比较基于机柜的微计算机断层扫描技术和基于同步辐射的断层扫描射线束的最新技术
- 作者：R. A. Rudolph; O. Brunke; A. Williams
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
5.Enhanced Multi-Modal 3D Analysis of Materials Using FIB-SEM Serial Sectioning

机译：使用FIB-SEM串行切片的增强型材料多模态3D分析
- 作者：H. Fleurkens; D. Phifer; T. Vystav(e)l; M. Castagna
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
6.Three-dimensional Structural and Chemical Characterization via STEM of a Candidate Standard Reference Material for Atom Probe Tomography

机译：通过STEM对原子探针层析成像的候选标准参考材料进行三维结构和化学表征
- 作者：A. Herzing; K. Henry; E. Steel
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
7.Photoemission Processes for Ultrafast TEM

机译：超快TEM的光发射过程
- 作者：W.A. Schroeder; J.A. Berger; A.W. Nicholls; N.J. Zaluzec; D.J. Miller
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
8.Laser-Specimen Interactions in Atom Probe Tomography

机译：原子探针层析成像中的激光标本相互作用
- 作者：Thomas F. Kelly; Joseph H. Bunton; Ty J. Prosa; Robert M. Ulfig; Peter H. Clifton; David J.Larson
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
9.Advantages of Focused Ion Beam to Understand Redeposition, Secondary Sputtering Effects and to Create Microfluidic Structures

机译：聚焦离子束的优点是可以理解再沉积，二次溅射效应并创建微流体结构
- 作者：Laxmikant V. Saraf; David W. Britt
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
10.Fabication of GaN Islands at Specific Locations on Si Substrates using FIB Induced Ga Surface Precipitation and Plasma Nitridation

机译：使用FIB诱导的Ga表面沉淀和等离子体氮化在Si衬底上特定位置处制造GaN岛
- 作者：Hao Wang; Jennifer L. Gray
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
11.3D Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion BeamScanning Electron Microscopy

机译：聚焦离子束扫描电子显微镜对干漆膜中颜料分散度的3D表征
- 作者：JuiChing Lin;William Heeschen;John Reffner;John Hook
- 会议名称：《》 | 2012年
12.New Processes and Modules for Improvements in Beam Chemistry

机译：改进束化学的新工艺和模块
- 作者：J.J.L. Mulders; D. Wall; L.Y. Roussel
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
13.Application of FIB/SEM and Argon Ion Milling to the Study of Foliated Fine Grained Organic Rich Rocks

机译：FIB / SEM和氩离子铣削在叶状细粒有机富集岩研究中的应用
- 作者：C. H. Sondergeld; M. E. Curtis; C. S. Rai
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
14.Dislocation Analysis in Metal-Oxide Materials and Devices by Electron Channeling Contrast Imaging

机译：电子通道对比成像法分析金属氧化物材料和器件中的位错
- 作者：Ranga J. Kamaladasa; Mohammad Norman; Yimeng Lu; James A. Bain; Paul A. Salvador; Marc De Graef; Marek Skowronski; Yoosuf N. Picard
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
15.Surface Preparation for Characterizing Microstructure on Transuranic Oxides by Electron Backscatter Spectroscopy and Ion Beam Imaging

机译：电子反散射光谱和离子束成像表征超铀氧化物微观结构的表面制备
- 作者：Pallas Papin; Ching-Fong Chen; Robert Forsyth; Erik Luther; Carl Necker
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
16.Zone axis STEM defect imaging based on electron Kossel patterns

机译：基于电子Kossel图案的区域轴STEM缺陷成像
- 作者：P.J. Phillips; J. Kwon; M.C. Brandes; M.J. Mills; M. De Graef
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
17.Vortex Beams Hosted in On-Axis Crystals

机译：同轴晶体中的涡流光束
- 作者：Huolin L. Xin; Haimei Zheng
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
18.Facile Syntheses of Photoactivatable Rhodamines for Super-Resolution Microscopy

机译：用于超分辨显微镜的光活化若丹明的简便合成
- 作者：Luke D. Lavis; Jonathan B. Grimm; Laura M. Wysocki; Ariana N. Tkachuk; Timothy A. Brown; Eric Betzig
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
19.Dislocation Identification and Mapping in GaN by Electron Channeling Contrast Imaging

机译：电子沟道对比度成像技术在GaN中进行位错识别与制图
- 作者：Y.N. Picard; R.J. Kamaladasa; F. Liu; L. Huang; L. Porter; R.F. Davis
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
20.Fast Single Molecule Position Determination using Graphics Processing Units

机译：使用图形处理单元快速确定单分子位置
- 作者：K. A. Lidke
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
21.Super-Resolution Microscopy Reveals Mechanistic Details of Bacterial Cell Division

机译：超高分辨率显微镜显示细菌细胞分裂的机制细节
- 作者：P. Eswara Moorthy; M. L. Erb; J. A. Gregory; J. Silverman; K. Pogliano; J. Pogliano; K. S.Ramamurthi
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
22.In-situ Straining Analysis by TEM Orientation Mapping (EBSD-like TEM) - Direct Imaging of Deformation Processes in Nanocrystalline Metals

机译：通过TEM方向图（类似于EBSD的TEM）进行原位应变分析-纳米晶体金属中变形过程的直接成像
- 作者：Aaron Kobler; Horst Hahn; Christian Kübel
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
23.High Angular Resolution Electron Channeling X-ray/Electron Spectroscopy

机译：高角分辨率电子通道X射线/电子光谱
- 作者：Nestor J. Zaluzec
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
24.Electron Channeling Contrast Image (ECCI) Simulations

机译：电子通道对比度图像（ECCI）模拟
- 作者：M. De Graef
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
25.Cryo-FIB of GaSb and InSb and Temperature Control Effects on Milling

机译：GaSb和InSb的低温FIB及温度控制对铣削的影响
- 作者：Christopher Santeufemio
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
26.Combined plasma FIB-SEM

机译：组合血浆FIB-SEM
- 作者：J. Jiruše; T. Hrnčí®; F. Lopour; M. Zadražil; A. Delobbe; O. Salord
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
27.Reliable Solution for ultra-thin HRTEM Lamella Fabrication by means of BSE Thickness Mapping in Combination with the novel 'X2' Preparation Method

机译：通过BSE厚度映射结合新颖的“ X2”制备方法来制造超薄HRTEM薄片的可靠解决方案
- 作者：R. Salzer; L. Lechner
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
28.EnzMet?: An Enzymatic Metallography Reagent for Accurately DelineatingNeuronal Boundaries for Segmenting Gap Junction-Coupled Neurons in theirThree-dimensional Space

机译：EnzMet ?：一种酶法金相试剂，用于准确描绘神经元边界，以在三维空间中分割间隙连接的耦合神经元。
- 作者：Irma I. Torres-Vazquez; Jose L. Serrano-Velez; François Orange; Maxime J.F. Guinel; Ioannis Koutis; Johanna Wolf; Christoph Laimer; Vishwas Joshi; Richard D. Powell; Eduardo Rosa-Molinar
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
29.Extending Subdiffractive Fluorescence Microscopy to Thicker Samples

机译：将亚衍射荧光显微镜扩展到更厚的样品
- 作者：A.G. York; H. Shroff
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
30.New Insights on Quantitative Microstructure Characterization by Electron Channeling Contrast Imaging Under Controlled Diffraction Conditions inSEM

机译：受控衍射条件下电子通道对比度成像定量显微组织表征的新见解
- 作者：I. Gutierrez-Urrutia; D. Raabe
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
31.Characterization of Dislocation Contrast in Deformed Steels with BCC Structure by Electron Channeling Contrast Imaging Method

机译：电子通道对比成像法表征BCC结构变形钢中的位错对比
- 作者：M.Sugiyama; G.Shigesato; Y. Shinohara
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
32.Quantitative Defect Analysis using Electron Channeling Contrast Imaging Under Controlled Diffraction Conditions (cECCI)

机译：在受控衍射条件下（cECCI）使用电子通道对比度成像进行定量缺陷分析
- 作者：N. Elhami; C. Tasan; S. Zaefferer
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
33.Quantitative Measurement of the Plastic Strain Field at a Fatigue Crack Tip using Backscattered Electron Images

机译：利用反向散射电子图像定量测量疲劳裂纹尖端的塑性应变场。
- 作者：Y.Yang; M. Crimp; R.A. Tomlinson; E.A. Patterson
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
34.Ion Channeling vs. Electron Channeling Image Contrast

机译：离子通道与电子通道图像对比
- 作者：L.A. Giannuzzi; J. R. Michael
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
35.Channeling Contrast in Helium Ion Microscopy

机译：氦离子显微镜中的通道对比
- 作者：David C. Bell
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
36.Channeling in Scanning Transmission Helium-Ion Microscopy

机译：扫描透射氦离子显微镜中的通道
- 作者：L.J. Allen; A.J. D’Alfonso
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
37.Comparison of Electron Channeling Contrast Imaging (ECCI) and Electron Back Scattered Diffraction (EBSD) using Hitachi SU8000 FE-SEM

机译：使用Hitachi SU8000 FE-SEM比较电子通道对比度成像（ECCI）和电子背向散射衍射（EBSD）
- 作者：S. Kaboli; J. Su; R. Gauvin
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
38.Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)

机译：使用高分辨率电子背散射衍射（HR-EBSD）和电子通道对比度成像（ECCI）表征商业纯钛中的滑移传递
- 作者：J.R. Seal; T.B. Britton; A.J. Wilkinson; T.R. Bieler; M.A. Crimp
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
39.The contrast mechanisms of LL-BSE electrons from hybridization & band gaps

机译：杂化和带隙引起的ALL-BSE电子的对比机理
- 作者：Heiner Jaksch
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
40.STEM Tomography of Micrometer-thick Neuronal Tissues

机译：微米级神经组织的STEM断层扫描
- 作者：A.A. Sousa; D.M. Cox; V.V. Wankhede; X. Chen; J. Zhang; J.S. Diamond; T.S. Reese; R.D. Leapman
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
41.Micro CT and SEM Observations of the Structural Evolution of Ice Sphere Arrays under a Temperature Gradient.

机译：温度梯度下冰球阵列结构演变的Micro CT和SEM观察。
- 作者：S. Chen; I. Baker
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
42.Single Particle Tomography in EMAN2

机译：EMAN2中的单粒子层析成像
- 作者：J. G. Galaz; J. F. 4th Flanagan; M. F. Schmid; W. Chiu; S. J. Ludtke
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
43.Cryo-Electron Tomography Reveals Novel Features of Cilia and Flagella

机译：低温电子断层扫描揭示了纤毛和鞭毛的新特征
- 作者：D. Nicastro; T. Heuser; J. Lin; C.F. Barber
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
44.A Comparison of Nano – Scale X-Ray Microscopy and Scanning Transmission Electron Microscopy applied to TiO_2 Nanoparticles in a Microbial Food Chain

机译：纳米X射线显微镜和扫描透射电子显微镜应用于微生物食物链中TiO_2纳米颗粒的比较。
- 作者：J.H. Priester; J. Gelb; R.E. Mielke; R. Werlin; E. Orias; P.A. Holden
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
45.3D non-destructive grain orientation mapping of polycrystalline materials using 3D-XRD and TEM

机译：使用3D-XRD和TEM进行多晶材料的3D无损晶粒取向映射
- 作者：X. Huang; H.F. Poulsen; S. Schmidt; H.H. Liu; A. Godfrey
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
46.Formation of Markers by a Helium Ion Microscope for TEM Tomography

机译：TEM层析用氦离子显微镜标记的形成
- 作者：M. Hayashida; T. Iijima; M. Tsukahara; T. Fujimoto; S. Ogawa
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
47.SEM 3D Reconstruction of Stained Bulk Samples using Landing Energy Variation and Deconvolution

机译：使用着陆能量变化和反卷积的SEM 3D重建散装样品
- 作者：F. Boughorbel; X. Zhuge; P. Potocek; B. Lich
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
48.Modeling and Comparison of Interrupted In-situ 3D X-ray Tomographic Imaging of Foams in Compression

机译：泡沫在压缩中的中断原位3D X射线层析成像的建模和比较
- 作者：B.M. Patterson; K. Henderson; Z. Smith; D. Zhang; P. Giguere; J. Gelb; A. Merkle
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
49.Crystallite Thickness Estimates from Precession Electron Diffraction Patterns for Structural Fingerprinting in the Quasi-kinematic Limit

机译：准运动极限中结构指纹的进动电子衍射图案的晶体厚度估计。
- 作者：P. Moeck; J. C. Straton; S. Rouvimov; I. Haeusler
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
50.Fourier Transform Holography: A Lensless Non-destructive Imaging Technique

机译：傅里叶变换全息术：无透镜无损成像技术
- 作者：M. Saliba; T. Latychevskaia; J.N. Longchamp; H.W. Fink
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
51.Quantitative Approaches for in situ SEM and TEM Deformation Studies

机译：原位SEM和TEM变形研究的定量方法
- 作者：Gerhard Dehm; Daniel Kiener; Christian Motz; Martin Smolka; Reinhard Pippan
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
52.Particle Imaging and Flow Visualization of In-situ TEM Nanoreactors

机译：原位TEM纳米反应器的颗粒成像和流动可视化
- 作者：I. Puspitasari; P. Saputra; B. Morana; L. Mele; F. Santagata; J.F. Creemer; F. Kapteijn; P.J Kooyman
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
53.Synthesis, Characterization, and Mechanical Behavior of Nanocrystalline Al-O Thin Film Alloys

机译：纳米晶Al-O薄膜合金的合成，表征和力学行为
- 作者：Mo-Rigen He; Patrick J. Malone; Gang Feng; Daniel S. Gianola
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
54.A Study of Helium Ion Beam Substrate Interaction Volume on Nanomachining Profiles in Bulk Substrates and Thin Film Membranes

机译：氦离子束基质相互作用体积对大体积基质和薄膜膜纳米加工轮廓的影响
- 作者：Richard H. Livengood; Shida Tan; Yuval Greenzweig; Roy Hallstein; Chris Scheffler; DarrylShima; Kate Klein; Andras E Vladar
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
55.Towards Secondary Ion Mass Spectrometry On The Helium Ion Microscope

机译：迈向氦离子显微镜上的二次离子质谱
- 作者：T. Wirtz; L. Pillatsch; N. Vanhove; D. Dowsett; S. Sijbrandij; J. Notte
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
56.Characterization of Damage in SiO_2 during Helium Ion Microscope Observation by Luminescence and TEM-EELS

机译：发光和TEM-EELS表征氦离子显微镜观察时SiO_2的损伤
- 作者：S. Ogawa; T. Iijima; S. Awata; R. Sugie; N. Kawasaki; Y. Otsuka
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
57.Site Specific He Ion Irradiation Damage Studies in Nanolayered Thin Films by Cross-Coupling Helium Ion Microscopy with TEM and APT

机译：透射电镜和APT交叉耦合氦离子显微镜在纳米薄膜中的位点特定氦离子辐照损伤研究
- 作者：V. Shutthanandan; A. Devaraj; R. S. Vemuri; C. M. Wang; T. Varga; CH. Henager Jr.; S.Thevuthasan
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
58.Quantitative Dopant Contrast in Scanning Electron Microscope and Helium Ion Microscope Using Focused Ion Beam Prepared Specimens

机译：聚焦离子束制备样品在扫描电子显微镜和氦离子显微镜中的定量掺杂对比
- 作者：Y. Chen; D. Fox; C. Faulkner; R. O’Connell; H. Zhang
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
59.Electron Tomography at 2.4 ? Resolution

机译：2.4的电子断层扫描？解析度
- 作者：M. C. Scott; Chien-Chun Chen; Matthew Mecklenburg; Chun Zhu; Rui Xu; Peter Ercius; UlrichDahmen; B. C. Regan; Jianwei Miao
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
60.Adding New Dimension to Electron Tomography: Measuring Atomic Structures and Properties in 3D

机译：为电子断层摄影术增加新的维度：在3D中测量原子结构和性质
- 作者：S. Bals; B. Goris; G. Van Tendeloo
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
61.3D EDX Microanalysis by FIB-SEM: Elemental Quantification Enhancement

机译：通过FIB-SEM进行3D EDX微量分析：元素定量增强
- 作者：P. Burdet; C. Hébert; M. Cantoni
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
62.3D Imaging of Defects in Crystalline Superlattices of CdS Clusters by Electron Tomography

机译：CdS团簇晶体超晶格缺陷的3D成像电子断层扫描
- 作者：C. Kübel; Tetyana Levchenko; John F. Corrigan
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
63.Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

机译：双像差校正透射电子显微镜中扫描共聚焦电子显微镜的最新进展
- 作者：P.Wang; A.I. Kirkland; P.D. Nellist; A.J. D’Alfonso; A.J. Morgan; L.J. Allen; A. Hashimoto; M.Takeguchi; K. Mitsuishi; M. Shimojo
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
64.Three-Dimensional Reconstruction Of The Amphid Sensory Primary Cilia Of C. elegans By Serial Section Electron Microscopy

机译：连续截面电子显微镜对秀丽隐杆线虫感觉原发纤毛的三维重建
- 作者：C. Berciu; D.B. Doroquez; P. Sengupta; D. Nicastro
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
65.New Applications in Atom Probe Tomography

机译：原子探针层析成像的新应用
- 作者：D.J. Larson; V.S. Smentkowski; L. M. Gordon; D. Joester; K. Inoue; D. A. Reinhard; T.J.Prosa; D. Olson; D. Lawrence; P. H. Clifton; R. M. Ulfig; I. Martin; T.F. Kelly
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
66.Atom Probe Tomography Analysis of Grain Boundaries in CdTe

机译：CdTe中晶界的原子探针层析成像分析
- 作者：D.J. Larson; V.S. Smentkowski; D. A. Reinhard; T.J. Prosa; D. Olson; D. Lawrence; P. H. Clifton; R. M. Ulfig; T.F. Kelly
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
67.Latest Developments on NanoSIMS Instrumentation for Life Science and Materials

机译：用于生命科学和材料的NanoSIMS仪器的最新进展
- 作者：F. Horréard; F. Hillion
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
68.Characterization of Fine Surface Structure with a New Electron Detection System in FE-SEM

机译：用新型电子检测系统在FE-SEM中表征精细表面结构
- 作者：Y.Sakuda; S.Asahina; K.Tsutsumi; M. Shibata; N.Erdman; M.Kudo
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
69.Applying an Atomic Force Microscopy in the Study of Sulfide Flotation

机译：原子力显微镜在硫化物浮选研究中的应用
- 作者：Jinhong Zhang; Wei Zhang
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
70.Characteristics in Valence-Band Emission Spectra of Simple Metals and Transition Metals Obtained by SXES-TEM

机译：SXES-TEM获得的简单金属和过渡金属的价带发射光谱特征
- 作者：M. Terauchi; H. Takahashi; N. Handa; T. Murano; M. Koike; T. Kawachi; T. Imazono; N. Hasegawa; M. Koeda; T. Nagano; H. Sasai; Y. Oue; Z. Yonezawa; S. Kuramoto
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
71.Defining a Minimum Analytical Mass in Geological Reference Samples Using uXRF Mapping Capacity

机译：使用uXRF映射能力定义地质参考样品中的最小分析质量
- 作者：L.P Bédard; A. Néron; S.-J. Barnes
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
72.Prediction of Detection Limits of Micro X-Ray Fluorescence (μXRF)

机译：微型X射线荧光（μXRF）检测限的预测
- 作者：V.-D. Hodoroaba; V. Rackwitz
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
73.Surface Chemistry of A1(CH_3)_3 and TiCl_4 on GaAs(lOO) and InGaAs during the First Half-Cycle of Atomic Layer Deposition

机译：原子层沉积的第一个半周期内GaAs（100）和InGaAs上Al（CH_3）_3和TiCl_4的表面化学
- 作者：Bernal Granados; Fee Li Lie; A. J. Muscat
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
74.Synchrotron-Based Fourier Transform Infrared Chemical Imaging: Opportunities for Polymer Research

机译：基于同步加速器的傅立叶变换红外化学成像：聚合物研究的机会
- 作者：Miriam Unger; Carol J. Hirschmugl
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
75.Atom Probe Tomography for Surface and Near-Surface Applications

机译：适用于表面和近表面应用的原子探针层析成像
- 作者：Thomas F. Kelly; D.P. Olson; D. Reinhard; I. Martin; Daniel Lawrence; Ty J. Prosa; David J. Larson
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
76.Characterization of Embedded Metallic Nanoparticles in Oxides by Cross-Coupling Aberration-Corrected STEM and Atom Probe Tomography

机译：交叉耦合像差校正的STEM和原子探针层析成像技术表征氧化物中嵌入的金属纳米粒子。
- 作者：A. Devaraj; R. Colby; V. Shutthanandan; V. Subramanian; C.M. Wang; Daniel E. Perea; S.Thevuthasan
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
77.Detection and Analysis of the Native Oxide Layer and Material Transfer on the Near Apex Region of AFM Tips using Atom Probe Tomography

机译：使用原子探针层析成像技术检测和分析AFM针尖附近顶点区域的天然氧化物层和材料转移
- 作者：C. J. Tourek; S. Sundararajan
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
78.Frequency Modulated Kelvin Probe Force Microscopy to Map Surface Potential of Mixed Lipid Monolayers With and Without Cholesterol

机译：调频开尔文探针力显微镜绘制有和没有胆固醇的混合脂质单层的表面势
- 作者：R. Gaikwad; E. Drolle; Z. Leonenko
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
79.Enhanced Surface and In-Depth Characterization of Organic and Inorganic Materials Using XPS and Soft Depth Profiling with Argon Cluster Ion Beams

机译：使用XPS和使用氩簇离子束进行软深度轮廓分析来增强有机和无机材料的表面和深度表征
- 作者：B. R. Strohmeier; R. G. White; T. S. Nunney; P. Mack; A. E. Wright
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
80.Analysis of polymer surface structures using X-ray photoelectron spectroscopic imaging

机译：使用X射线光电子能谱成像分析聚合物表面结构
- 作者：R. G. White; A. E. Wright; P. Mack; T. S. Nunney
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
81.Advances in Atomic Force Microscopy, from Compositional Mapping to Quantitative Measurements

机译：原子力显微镜的最新进展，从成分图到定量测量
- 作者：C. Wall; J. Alexander; S. Belikov; S. Magonov
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
82.How to Obtain Rigidity Modulus of Biological Cells Using AFM

机译：如何使用原子力显微镜获得生物细胞的刚性模量
- 作者：I. Sokolov; M. Dokukin; N. Guz; C.D. Woodworth
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
83.Nano-scale Fracture Test for Local Interface Adhesion Strength Evaluation in LSI Interconnects

机译：纳米级断裂测试用于LSI互连中的局部界面粘合强度评估
- 作者：N. Shishido; H. Sugiyama; S. Kamiya; H. Sato; K. Koiwa; M. Nishida; M. Omiya; T. Nagasawa; T. Nokuo; T. Suzuki; T. Nakamura
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
84.Size and Shape Effects on the Mechanical Deformation of 1-nm-wide Gold Nanorods

机译：尺寸和形状对1nm宽金纳米棒机械变形的影响
- 作者：M. J. Lagos; F. Sato; D. S. Galvão; D. Ugarte
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
85.In-situ TEM compression testing of Ti-7wt%Al nanopillars

机译：Ti-7wt％Al纳米柱的原位TEM压缩测试
- 作者：E. Tochigi; M. C. Brandes; M. J. Mills; A. M. Minor
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
86.HR-STEM In-Situ Mechanical Testing of FIB Samples

机译：FIB样品的HR-STEM原位机械测试
- 作者：R. Veillette; L. Rodrigue; M.L. Trudeau
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
87.Analysis of Thermomechanical Processing of AA5083 for Corrosion Resistance

机译：耐腐蚀AA5083的热机械工艺分析。
- 作者：Joseph C. Hsieh; Daniel Scotto D'Antuono; Christopher M. Barr; Jennifer Gaies; William Golumbfskie; Mitra L. Taheri
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
88.High Spatial Resolution X-ray Spectra of Mg, Al, Si and P L-Emission Observed with a Newly Developed Soft X-ray Spectrometer for EPMA

机译：用新开发的EPMA软X射线光谱仪观察到Mg，Al，Si和P L发射的高空间分辨率X射线光谱
- 作者：T. Murano; H. Takahashi; N. Handa; M. Terauchi; M. Koike; T. Kawachi; T. Imazono; N. Hasegawa; M. Koeda; T. Nagano; H. Sasai; Y. Oue; Z. Yonezawa; S. Kuramoto
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
89.Modification of the Kevlar-29 Fibers Tensile Properties after a Brine (NaCl) Treatment

机译：盐水（NaCl）处理后Kevlar-29纤维拉伸性能的改变
- 作者：A-Tejeda-Ochoa; W. Antúnez-Flores; R. Martínez-Sánchez; J.M. Herrera-Ramírez
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
90.In situ SEM Study of Microbeam Bending of Aluminide Bond Coats

机译：铝化物粘结涂层微束弯曲的原位SEM研究
- 作者：Nagamani Jaya B; Sanjit Bhowmick; S. A. Syed Asif; Oden L. Warren; Vikram Jayaram; Sanjay K. Biswas
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
91.Microstructural and Mechanical Properties of a 304 Stainless Steel Fiber

机译：304不锈钢纤维的显微组织和力学性能
- 作者：K.A. García-Aguirre; J.A. García-Estrada; W. Antúnez-Flores; R. Torres-Sánchez; J.M.Herrera-Ramírez
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
92.Modular Nano-Positioning System for Phase Plates

机译：用于相板的模块化纳米定位系统
- 作者：Patrick Kurth; S. Pattai; S. H. Irsen
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
93.The Tensile Behavior of E-glass Fibers

机译：电子玻璃纤维的拉伸行为
- 作者：E.J. Parra-Venegas; A. Rodríguez-Miranda; K. Campos-Venegas; R. Martínez-Sánchez; J.M.Herrera-Ramírez
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
94.Twin-Foucault Imaging for Observing 180° Domains in Magnetic Materials

机译：双震成像可观察磁性材料中的180°域
- 作者：Ken Harada
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
95.Semi-Quantitative TEM Characterization of ReS_2 Nanoparticles

机译：ReS_2纳米颗粒的半定量TEM表征
- 作者：C.E. Kliewer; T.C. Ho; J.M. McConnachie
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
96.Development and Application of a Novel Characterization System to Quantify Grain Structures of Nickel Superalloys in 3D

机译：新型表征系统对3D镍合金的晶粒结构进行定量分析
- 作者：Michael Uchic; Megna Shah; Michael Groeber; Patrick Callahan; Adam Shiveley
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
97.Advanced Analysis of 3D EBSD Data Obtained from FIB-EBSD Tomography

机译：从FIB-EBSD层析成像获得的3D EBSD数据的高级分析
- 作者：S. Zaefferer; P. Konijnenberg
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
98.Single Atom Microscopy

机译：单原子显微镜
- 作者：Wu Zhou; Jaekwang Lee; Micah P. Prange; Mark P. Oxley; Andrew R. Lupini; Ondrej L. Krivanek; Sokrates T. Pantelides; Stephen J. Pennycook; Juan-Carlos Idrobo
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
99.Substitutional and Interstitial Diffusion of Ni Across the NiSi/Si Interface

机译：Ni在NiSi / Si界面上的取代和填隙扩散
- 作者：A.M. Thron; J. Chan; T.J. Pennycook; S.J. Pennycook; A. Jain; C.L. Hinkle; K. vanBenthem
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年
100.Investigation of Grain Boundary Structure and Composition of Bismuth Embrittled Copper Bicrystals with Aberration-Corrected Scanning Transmission Electron Microscopy

机译：像差校正扫描透射电子显微镜研究铋脆铜双晶的晶界结构和组成
- 作者：C. A. Wade; L. Giannuzzi; M. McLean; R. Vinci; M. Watanabe
- 会议名称：《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》 | 2012年