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Characterization of SAC - x NiO nano-reinforced lead-free solder joint in an ultra-fine package assembly

机译:超细包装组件中SAC - X NIO纳米钢筋无铅焊点的特征

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Purpose This study aims to investigate the NiO nano-reinforced solder joint characteristics of ultra-fine electronic package. Design/methodology/approach Lead-free Sn-Ag-Cu (SAC) solder paste was mixed with various percentages of NiO nanoparticles to prepare the new form of nano-reinforced solder paste. The solder paste was applied to assemble the ultra-fine capacitor using the reflow soldering process. A focussed ion beam, high resolution transmission electron microscopy system equipped with energy dispersive X-ray spectroscopy (EDS) was used in this study. In addition, X-ray inspection system, field emission scanning electron microscopy coupled with EDS, X-ray photoelectron spectroscopy (XPS) and nanoindenter were used to analyse the solder void, microstructure, hardness and fillet height of the solder joint. Findings The experimental results revealed that the highest fillet height was obtained with the content of 0.01 Wt.% of nano-reinforced NiO, which fulfilled the reliability requirements of the international IPC standard. However, the presence of the NiO in the lead-free solder paste only slightly influenced the changes of the intermetallic layer with the increment of weighted percentage. Moreover, the simulation method was applied to observe the distribution of NiO nanoparticles in the solder joint. Originality/value The findings are expected to provide a profound understanding of nano-reinforced solder joint's characteristics of the ultra-fine package.
机译:目的本研究旨在研究超细电子封装的NIO纳米增强焊点特性。设计/方法/方法无铅Sn-Ag-Cu(SAC)焊膏与各种百分比的NiO纳米颗粒混合以制备新形式的纳米增强焊膏。焊膏用于使用回流焊接工艺组装超细电容器。本研究使用了配备能量分散X射线光谱(EDS)的高分辨率离子束,高分辨率透射电子显微镜系统。此外,使用X射线检测系统,与EDS,X射线光电子能谱(XPS)和纳米茚,X射线检测系统,X射线光电子能谱(XPS)和纳米茚,分析焊点的焊料空隙,微观结构,硬度和圆角高度。结果表明,实验结果表明,最高的圆角高度得到了0.01重量%的含量为0.01重量%。纳米加固NIO的百分比,实现了国际IPC标准的可靠性要求。然而,在无铅焊膏中存在NIO的存在仅略微影响金属间层的变化与加权百分比的增量。此外,施用模拟方法观察焊点中NiO纳米粒子的分布。原创性/价值预计将对纳米增强焊接关节的超细包装特性提供深远的理解。

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