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Predictable quantum efficient detector based on n-type silicon photodiodes

机译:基于N型硅光电二极管的可预测量子有效探测器

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The predictable quantum efficient detector (PQED) consists of two custom-made induced junction photodiodes that are mounted in a wedged trap configuration for the reduction of reflectance losses. Until now, all manufactured PQED photodiodes have been based on a structure where a SiO2 layer is thermally grown on top of p-type silicon substrate. In this paper, we present the design, manufacturing, modelling and characterization of a new type of PQED, where the photodiodes have an Al2O3 layer on top of n-type silicon substrate. Atomic layer deposition is used to deposit the layer to the desired thickness. Two sets of photodiodes with varying oxide thicknesses and substrate doping concentrations were fabricated. In order to predict recombination losses of charge carriers, a 3D model of the photodiode was built into Cogenda Genius semiconductor simulation software. It is important to note that a novel experimental method was developed to obtain values for the 3D model parameters. This makes the prediction of the PQED responsivity a completely autonomous process. Detectors were characterized for temperature dependence of dark current, spatial uniformity of responsivity, reflectance, linearity and absolute responsivity at the wavelengths of 488 nm and 532 nm. For both sets of photodiodes, the modelled and measured responsivities were generally in agreement within the measurement and modelling uncertainties of around 100 parts per million (ppm). There is, however, an indication that the modelled internal quantum deficiency may be underestimated by a similar amount. Moreover, the responsivities of the detectors were spatially uniform within 30 ppm peak-to-peak variation. The results obtained in this research indicate that the n-type induced junction photodiode is a very promising alternative to the existing p-type detectors, and thus give additional credibility to the concept of modelled quantum detector serving as a primary standard. Furthermore, the manufacturing of PQEDs is no longer dependent on the availability of a certain type of very lightly doped p-type silicon wafers.
机译:可预测的量子有效检测器(PQED)由两个定制的诱导的结光电二极管组成,该光电二极管安装在楔形的陷阱配置中,用于降低反射率损耗。到目前为止,所有制造的PQED光电二极管都基于在P型硅衬底顶部热生长SiO 2层的结构。在本文中,我们介绍了一种新型PQED的设计,制造,建模和表征,其中光电二极管在n型硅衬底上具有Al2O3层。原子层沉积用于将层沉积到所需的厚度。制造两组具有不同氧化物厚度和衬底掺杂浓度的光电二极管。为了预测电荷载波的重组损耗,内置了光电二极管的3D模型中的Cogenda Genius半导体模拟软件。值得注意的是,开发了一种新的实验方法来获得3D模型参数的值。这使得PQED响应性的预测完全自主过程。检测器的特征在于暗电流的温度依赖性,响应性,反射率,线性度和在488nm和532nm的波长下的反射率,线性度和绝对响应度的温度依赖性。对于两组光电二极管,所建模和测量的响应通常在测量和建模的不确定性约为100分(PPM)内。然而,存在模型内量子缺乏的指示可以通过类似的量低估。此外,探测器的响应在30ppm峰到峰变化范围内在空间均匀。本研究中获得的结果表明,N型诱导结光电二极管是对现有P型检测器的非常有希望的替代品,从而为用作主要标准的模型量子检测器的概念提供额外的可信度。此外,PQEDS的制造不再取决于某种非常轻微掺杂的P型硅晶片的可用性。

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