Structural study of the semimagnetic semiconductor Zn0.5Mn0.5In2Te4

摘要

The semimagnetic semiconductor alloy Zn0.5Mn0.5In2Te4 was refined from an X-ray powder diffraction pattern using the Rietveld method. This compound crystallizes in the space group I (4) over bar 2m (N degrees 121), Z = 2, with unit cell parameters a = 6.1738(1) angstrom, c = 12.3572(4) angstrom, V = 471.00(2) angstrom(3), c/a = 2.00. This material crystallizes in a stannite-type structure. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim