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首页> 外文期刊>Materials science in semiconductor processing >Investigation of 'fur-like' residues post dry etching of polyimide using aluminum hard etch mask
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Investigation of 'fur-like' residues post dry etching of polyimide using aluminum hard etch mask

机译:用铝硬蚀刻面罩对“毛皮”残留物的“毛状”残留物

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The authors found that oxygen plasma etching of polyimide (PI) with aluminum (Al) as a hard-etch mask results in lightly textured arbitrary shaped "fur-like" residues. Upon investigation, the presence of Al was detected in these residues. Ruling out several causes of metal contamination that were already reported in literature, a new theory for the presence of the metal containing residues is described. Furthermore, different methods for the residue free etching of PI using an Al hard-etch by using different metal deposition and patterning methods are explored. A fur-free procedure for the etching of PI using a one step-reactive ion etch of the metal hard-etch mask is presented.
机译:作者发现,用铝(Al)的聚酰亚胺(PI)作为硬蚀刻掩模的氧等离子体蚀刻导致轻微纹理的任意形状的“毛状”残基。 在调查后,在这些残留物中检测到Al的存在。 判断出在文献中已经报道的几种金属污染原因,描述了用于存在含金属残留物的新理论。 此外,探讨了通过使用不同的金属沉积和图案化方法使用Al硬蚀刻使用Al硬蚀刻的残基自由蚀刻的不同方法。 呈现了使用金属硬蚀刻掩模的一个阶梯反应离子蚀刻蚀刻PI的无自由程序。

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