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首页> 外文期刊>European journal of heart failure: journal of the Working Group on Heart Failure of the European Society of Cardiology >Cardiac implantable electronic devices with a defibrillator component and all‐cause mortality in left ventricular assist device carriers: results from the PCHF‐VAD registry
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Cardiac implantable electronic devices with a defibrillator component and all‐cause mortality in left ventricular assist device carriers: results from the PCHF‐VAD registry

机译:心脏可植入电子设备,具有除颤器组件和左心室辅助设备载波中的全导致死亡率:PCHF-VAD注册表结果

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Abstract Aims To compare characteristics of left ventricular assist device (LVAD) recipients receiving a cardiac implantable electronic device (CIED) with a defibrillator component (implantable cardioverter‐defibrillator and cardiac resynchronization therapy with defibrillation, CIED‐D) vs. those without one, and to assess whether carrying such a device contiguously with an LVAD is associated with outcomes. Methods and results Overall, 448 patients were analysed (mean age 52?±?13?years, 82% male) in the multicentre European PCHF‐VAD registry. To account for all active CIED‐Ds during ongoing LVAD treatment, outcome analyses were performed by a time‐varying analysis with active CIED‐D status post‐LVAD as the time‐varying covariate. At the time of LVAD implantation, 235 patients (52%) had an active CIED‐D. Median time on LVAD support was 1.1?years (interquartile range 0.5–2.0?years). A reduction of 36% in the risk of all‐cause mortality was observed in patients with an active CIED‐D [hazard ratio (HR) 0.64, 95% confidence interval (CI) 0.46–0.91; P ?=?0.012), increasing to 41% after adjustment for baseline covariates (HR 0.59, 95% CI 0.40–0.87; P ?=?0.008) and 39% after propensity score adjustment (HR 0.61, 95% CI 0.39–0.94; P ?=?0.027). Other than CIED‐D, age, LVAD implant as redo surgery, number of ventricular arrhythmia episodes and use of vasopressors pre‐LVAD were remaining significant risk factors of all‐cause mortality. Incident ventricular arrhythmias post‐LVAD portended a 2.4‐fold and 2.6‐fold increased risk of all‐cause and cardiovascular death, respectively; carrying an active CIED‐D remained associated with a 47% and 43% reduction in these events, respectively. Conclusions In an analysis accounting for all active CIED‐Ds, including those implanted during LVAD support, carrying such a device was associated with significantly better survival during LVAD support.
机译:摘要旨在比较左心室辅助装置(LVAD)接受者接受心脏可植入的电子设备(CIED)的特性,用除颤器组分(具有除颤,CIED-D)的除颤器组分(植入的心脏除颤器和心脏再同步疗法)与没有一个的人和为了评估与LVAD连续地携带这种装置是否与结果相关联。方法和结果总体上,分析了448名患者(平均52岁?为了考虑在正在进行的LVAD处理期间的所有活性CIED-DS,结果分析是通过随着时间变化的时变性的时变分析来进行时间变化分析作为时变的协变量。在Lvad植入时,235名患者(52%)有活跃的CIED-D。 LVAD支持的中位数是1.1?年(四分位数范围0.5-2.0?年)。在有活性CIED-D [危害比(HR)0.64,95%置信区间(CI)0.46-0.91的患者中,观察到所有原因死亡率风险的降低36%。 p?= 0.012),对基线协变量的调节后增加至41%(HR 0.59,95%CI 0.40-0.87; p?= 0.008)和39%后,在倾向得分调节后(HR 0.61,95%CI 0.39-0.94 ; p?= 0.027)。除了CIED-D,年龄,LVAD植入物作为重做手术,室性心律失常的次数和血管加压素前的使用仍然存在重大的全导致死亡风险因素。入射式室外心律失常后LVAD分别分别预测了2.4倍,增加了2.6倍的全部原因和心血管死亡风险;携带活跃的CIED-D分别与这些事件的减少47%和43%相关。在分析核算中的结论,包括在LVAD支持期间植入的所有活性CIED-DS的分析,携带这种装置与LVAD支持期间的生存明显更好。

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