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Corrosion failure analysis of printed circuit boards exposed to H2S-containing humid environments

机译:含有H2S湿润环境暴露的印刷电路板的腐蚀失效分析

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摘要

The corrosion failure of a printed circuit board (PCB) with electroless nickel/immersion gold (ENIG) surface finish in a hydrogen sulfide-containing humid environment was analyzed in this work. To establish a comprehensive mechanism for the damage, the exposed surfaces were characterized by visual inspection, scanning electron microscopy/energy-dispersive X-ray spectroscopy and X-ray photoelectron spectroscopy. It was realized that merely copper traces under the edge of soldermasks (on electrical junctions) suffer a galvanic-type corrosion reaction with hydrogen sulfide and moisture adsorbed, forming dominantly copper sulfides and a small amount of copper sulfate and oxide. The creep of the corrosion products on the surfaces of ENIG-plated layers, tin-based solders and adjacent soldermasked areas was also found to be responsible for creating short circuits on the outer layers of the miniaturized PCB.
机译:在这项工作中分析了在含硫化硫化硫化物湿法环境中具有无电镀镍/浸渍金(ENIG)表面光洁度的印刷电路板(PCB)的腐蚀性故障。 为了树立造成伤害的综合机制,通过目视检查,扫描电子显微镜/能量分散X射线光谱和X射线光电子能量的特征在于曝光表面。 它实现了蜡渣边缘(电交叉点)下的铜痕迹仅与吸附的硫化氢和水分的电流式腐蚀反应遭受电抗型腐蚀反应,形成主要硫化铜和少量硫酸铜和氧化铜。 还发现,螺旋焊接层,锡焊料和相邻焊接区域的表面上的腐蚀产品的蠕变是负责在小型化PCB的外层上产生短路。

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