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Effect of Solvents and Stabilizer Molar Ratio on the Growth Orientation of Sol-Gel-Derived ZnO Thin Films

机译:溶剂和稳定剂摩尔比对溶胶 - 凝胶衍生ZnO薄膜生长取向的影响

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This work targets to control the growth orientation of sol-gel-derived ZnO thin films in order to allow different modes of excitation (longitudinal and transverse) when targeted to be used in piezoelectric applications. For that, the effect of solvents and stabilizer molar ratio on the structural and optical characteristics of the obtained films is investigated by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), and UV-Vis spectrophotometry. The XRD results show clearly that the synthesized films exhibit hexagonal wurtzite structure without any secondary phases and that the crystallite average size, estimated by the Scherrer formula, is ranged between 13 and 30 nm. The main finding of this work is to show that the control of the crystalline growth orientation is possible simply by varying the solvent nature and/or the stabilizer molar ratio. These later parameters are therefore considered as key factors when seeking to develop the ZnO-based transducers. Actually, the ZnO thin films synthesized with propanol as solvent are oriented only along the c-axis; meanwhile, when using the isopropanol or ethanol, other preferential orientations appear. Additionally, the effect of MEA molar ratio (r) has been studied on the propanol-derived films (the unfavorable case). It has been found that this parameter has a direct effect on the crystalline growth orientation of these films and that a new preferential orientation (100) appears at low r. On the other hand, SEM images show the formation of homogeneous nanocrystalline thin films with an average grain size ranged between 19 and 35 nm. Moreover, the ZnO thin films exhibit a high transparency in the visible region, and the measured transmittance is ranged from 85 to 97%. However, the change of ZnO film orientation has no significant effect on the direct bandgap energy which is closed to 3.30 eV.
机译:该工作靶向控制溶胶 - 凝胶衍生的ZnO薄膜的生长取向,以允许当靶向压电应用中使用时允许不同的激发模式(纵向和横向)。为此,通过X射线衍射(XRD),扫描电子显微镜(SEM)和UV-Vis分光光度法,研究了溶剂和稳定剂摩尔比对所得薄膜的结构和光学特性的影响。 XRD结果表明,合成的薄膜表现出没有任何副相的六边形紫立岩结构,并且通过Scherrer公式估计的微晶平均尺寸在13至30nm之间。本作作品的主要发现是表明,通过改变溶剂性质和/或稳定剂摩尔比来简单地进行结晶生长取向的控制。因此,这些后来的参数被视为寻求开发基于ZnO的换能器时的关键因素。实际上,用丙醇合成的ZnO薄膜作为溶剂仅取向C轴;同时,使用异丙醇或乙醇时,出现其他优先取向。另外,已经在丙醇衍生的膜上研究了MEA摩尔比(R)的效果(不利的情况)。已经发现该参数对这些薄膜的结晶生长取向直接影响,并且在低r处出现新的优先定向(100)。另一方面,SEM图像显示均匀纳米晶体薄膜的形成,平均晶粒尺寸在19至35nm之间。此外,ZnO薄膜在可见区域中表现出高透明性,并且测量的透射率范围为85至97%。然而,ZnO膜取向的变化对直接带隙能量没有显着影响,该能量关闭至3.30eV。

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