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首页> 外文期刊>Intermetallics >Enhanced hole concentration through Ga doping and excess of Mg and thermoelectric properties of p-type Mg_2(1+Z)(Sio.3Sno.7)_(1-y) Ga_y
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Enhanced hole concentration through Ga doping and excess of Mg and thermoelectric properties of p-type Mg_2(1+Z)(Sio.3Sno.7)_(1-y) Ga_y

机译:通过Ga掺杂和过量的Mg和过量的mg和P型Mg_2(1 + Z)(SiO 3 SnO.7)_(1-Y)Ga_y的镁掺杂和过量的空穴浓度

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摘要

The influence of the doping amount of Ga as well as the excess of Mg on the phase composition and thermoelectric properties of Mg_2(1+Z)(Sio.3Sno.7)_(1-y) Ga_y compounds are analyzed in detail. Regarding the content of Mg, a second phase of Mg is detected at grain boundaries whenever its over-stoichiometry exceeds 7%. On the other hand, XRD and EPMA analysis indicate that phase separation occurs when Mg is more than 3.5% deficient with respect to its stoichiometric amount. Thermoelectric property measurements reveal that doping with Ga, along with some over-stoichiometry of Mg, enhances the concentration of holes and electrical conductivity of Mg_2(1+Z)(Sio.3Sno.7)_(1-y) Ga_y, while it simultaneously reduces the Seebeck coefficient However, there is little effect on the lattice thermal conductivity. The results also show that, in p-type Mg_2Si_(o.3)Sn_(o.7) based compounds, antisite point defects Mgsi form when the content of Mg is over-stoichiometric. This leads to an enhanced concentration of holes. Mg_(2.1o)(Si_(o.3)Sn_(o.7))_(o.95)Ga_(o.o5), having the optimized content of Ga and Mg, possesses the highest ZT value of 0.35 that is achieved at 650 K. This research reveals that both the doping of Ga and the excess of Mg do not have significant influence on the band structure of Mg_2Si_(0.3)Sn_(o.7), and the transport properties of p-type Mg_2Si_(o.3)Sn_(0.7) in the high hole concentration range can be well described by a simple, parabolic band model. The research work also establishes an important basis for further optimization of the figure of merit of p-type Mg_2Si_(1-x)Sn_x solid solutions by making use of over-stoichiometric amounts of Mg.
机译:详细地分析了Ga掺杂量的掺杂量以及多余的Mg的影响和Mg_2(1 + Z)(SiO 3 SNO.7)_(1-Y)GA_Y化合物的热电性能。关于Mg的含量,每当其过化学计量超过7%时,在晶界中检测Mg的第二阶段。另一方面,XRD和EPMA分析表明当MG相对于其化学计量量缺乏3.5%时,发生相分离。热电性能测量揭示了用Ga掺杂,以及Mg的一些过化学计量,增强了Mg_2(1 + Z)(SiO 3SnO.7)_(1-Y)Ga_y的孔和电导率的浓度同时减少塞贝克系数,但对晶格导热率几乎没有影响。结果还表明,在p型Mg_2SI_(O.3)Sn_(O.7)的基础化合物中,当Mg的含量过于化学计量时,抗腐蚀点缺陷MGSI形式。这导致增强的孔浓度。 MG_(2.1O)(SI_(O.3)SN_(O.7))_(O.95)GA_(O.5),具有GA和MG的优化含量,具有0.35的最高ZT值在650 K中实现。该研究表明,Ga的掺杂和过量的mg都没有对mg_2si_(0.3)sn_(o.7)的带状结构有显着影响,以及p型mg_2si_的传输属性( o.3)在高孔浓度范围内的SN_(0.7)可以通过简单的抛物线带模型进行很好的描述。研究工作还通过利用过化化学计量的Mg来进一步优化P型Mg_2Si_(1-X)Sn_x固体溶液的优化的重要依据。

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