首页> 外文期刊>Crystal growth & design >Image-analysis-based method for 3D crystal morphology measurement and polymorph identification using confocal microscopy
【24h】

Image-analysis-based method for 3D crystal morphology measurement and polymorph identification using confocal microscopy

机译:共聚焦显微镜的基于图像分析的3D晶体形态测量和多晶型识别方法

获取原文
获取原文并翻译 | 示例
           

摘要

A new technique for the measurement of 3D crystal morphology and identification of its polymorph using tomographic images is proposed. Confocal microscopy is used for the first time to obtain tomographic images of crystals that are coated with a suitable fluorescent dye. A convex polyhedron is fitted through a stack of tomographic images of a crystal to obtain the normal vectors of each facet and their corresponding perpendicular distances from the center of the crystal. The angular patterns are generated from the measured normal vectors and are matched with the master angular patterns of each polymorph. It is shown that the matching of the angular patterns is unique and provides a simpler way to identify polymorphs. An image-analysis program that can be integrated with conventional confocal microscopes was created to sequentially perform image processing, morphology measurement, and polymorph detection. This program was used to measure morphologies and identify polymorphs of 2D and 3D acetaminophen crystals. Detailed directions are provided to enable the application of the methodology without the need for special-purpose software. The image-analysis program is also suitable for repeated measurements to produce morphology distributions. This technique will provide an effective platform for measuring the 3D shapes of materials of interest to many applications.
机译:提出了一种新的测量3D晶体形态并使用断层图像识别其多晶型的技术。首次使用共聚焦显微镜获得涂覆有合适荧光染料的晶体的断层图像。凸多面体通过晶体的一堆层析图像进行拟合,以获得每个小平面的法向矢量以及它们与晶体中心的垂直距离。角度模式是从测量的法向矢量生成的,并且与每个多态的主角度模式匹配。结果表明,角度模式的匹配是唯一的,并且提供了一种识别多态的更简单方法。创建了可以与常规共焦显微镜集成的图像分析程序,以依次执行图像处理,形态测量和多态检测。该程序用于测量形态并识别2D和3D对乙酰氨基酚晶体的多晶型物。提供了详细的指导,以使该方法的应用成为可能,而无需专用软件。图像分析程序也适用于重复测量以产生形态分布。该技术将为测量许多应用感兴趣的材料的3D形状提供有效的平台。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号