首页> 外国专利> SYSTEMS AND METHODS FOR CONDUCTING CONTACT-FREE THICKNESS AND REFRACTIVE-INDEX MEASUREMENTS OF INTRAOCULAR LENSES USING A SELF-CALIBRATING DUAL CONFOCAL MICROSCOPY SYSTEM

SYSTEMS AND METHODS FOR CONDUCTING CONTACT-FREE THICKNESS AND REFRACTIVE-INDEX MEASUREMENTS OF INTRAOCULAR LENSES USING A SELF-CALIBRATING DUAL CONFOCAL MICROSCOPY SYSTEM

机译:使用自校准双共聚焦显微镜进行眼内透镜的无接触厚度和折射率折光率测量的系统和方法

摘要

Systems and methods for conducting contact-free thickness and refractive-index measurements of transparent objects, such as intraocular lenses using a dual confocal microscopy system are disclosed.
机译:公开了使用双共聚焦显微镜系统进行透明物体(例如眼内透镜)的无接触厚度和折射率测量的系统和方法。

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