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(I008)Ultra-rapid heating of Si wafer and GaN thin film and microwave heating mechanism

机译:(I008)超快速加热Si晶片和GaN薄膜和微波加热机构

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摘要

Semiconductor light emitting devices such as LED have excellent characteristics of power-saving, low voltage driving, and so they are used in various applications. LED elements are composed of different thin films such as GaN, transparent electrode on sapphire substrate. Microwave processing has many advantages such as rapid heating, selective heating and internal heating, and has begun to be applied to various heat treatments [1]. The heating is influenced by the permittivity of materials in microwave region. In this paper, we investigated the relationship between complex permittivity and microwave heating of LED elements. Next, we measured the complex permittivity of Si wafers and GaN thin films of different types in microwave region, and then the relationship between the electric conductivity (reciprocal of resistivity) and the microwave absorption was investigated. Furthermore, using a single mode cavity, we examined the influences of the resistivity of these samples, the substrate angle and electric (E) / magnetic (H) fields on microwave heating. The microwave heating mechanism of semiconductor materials will also be discussed.
机译:诸如LED的半导体发光器件具有优异的省电,低电压驱动特性,因此它们用于各种应用中。 LED元件由不同薄膜组成,例如GaN,在蓝宝石衬底上透明电极。微波处理具有许多优点,如快速加热,选择性加热和内部加热,并且已经开始应用于各种热处理[1]。加热受微波区中材料介电常数的影响。在本文中,我们调查了LED元件的复杂介电常数与微波加热之间的关系。接下来,我们测量了微波区中不同类型的Si晶片和GaN薄膜的复杂介电常数,然后研究了电导率(电阻率往复运动)与微波吸收之间的关系。此外,使用单模腔,我们检查了这些样品的电阻率,基板角和电(e)/磁性(H)场在微波加热上的影响。还将讨论半导体材料的微波加热机制。

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