Temperature dependence of the optical properties of thin Ge-Se-In films

摘要

This paper deals with the properties of the glasses and thin films from multi-component chalcogenide prepared by co-evaporation technique. The thin chalcogenide layers from the Ge30Se70-xInx system were deposited by thermal co-evaporation of bulk glasses from Ge-Se system and In2Se3. Using X-ray microanalysis it was found that the film compositions are close to the expected ones. The refractive index, n, and the optical band gap, E-g(opt), were determined by spectral ellipsometric measurements. The thin film's structure was investigated by Raman spectroscopy.