首页> 外文期刊>Journal of Electronic Materials >Large-Area Direct Hetero-Epitaxial Growth of 1550-nm InGaAsP Multi-Quantum-Well Structures on Patterned Exact-Oriented (001) Silicon Substrates by Metal Organic Chemical Vapor Deposition
【24h】

Large-Area Direct Hetero-Epitaxial Growth of 1550-nm InGaAsP Multi-Quantum-Well Structures on Patterned Exact-Oriented (001) Silicon Substrates by Metal Organic Chemical Vapor Deposition

机译:通过金属有机化学气相沉积在图案化精确定向(001)硅基板上的大面积直接异轴长度增长1550nm-nm ing-incum-pont结构

获取原文
获取原文并翻译 | 示例
           

摘要

We employ a simple two-step growth technique to grow large-area 1550-nm laser structures by direct hetero-epitaxy of III-V compounds on patterned exact-oriented (001) silicon (Si) substrates by metal organic chemical vapor deposition. Densely-packed, highly uniform, flat and millimeter-long indium phosphide (InP) nanowires were grown from Si v-grooves separated by silicon dioxide (SiO2) stripes with various widths and pitches. Following removal of the SiO2 patterns, the InP nanowires were coalesced and, subsequently, 1550-nm laser structures were grown in a single overgrowth without performing any polishing for planarization. X-ray diffraction, photoluminescence, atomic force microscopy and transmission electron microscopy analyses were used to characterize the epitaxial material. PIN diodes were fabricated and diode-rectifying behavior was observed.
机译:我们采用简单的两步生长技术,通过金属有机化学气相沉积在图案化的精确定向(001)硅(Si)衬底上直接杂交外延来生长大面积的1550nm激光结构。 从二氧化硅(SiO 2)条纹分离的Si V槽中,生长密集填充,高度均匀,平坦的磷化铟(InP)纳米线(SiO 2)条纹,具有各种宽度和俯仰。 在去除SiO 2图案之后,InP纳米线被聚结,随后,在单个过度生长的情况下生长1550nm激光结构,而不会对平坦化进行任何抛光。 X射线衍射,光致发光,原子力显微镜和透射电子显微镜分析用于表征外延材料。 销二极管是制造的,并且观察到二极管整流行为。

著录项

相似文献

  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号