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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Enhancement of multiferroic properties in Bi0.92Ho0.08Fe0.97Mn0.03O3/Zn0.5Ni0.5Fe2O4 bilayered thin films by tunable schottky barrier and interface barrier
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Enhancement of multiferroic properties in Bi0.92Ho0.08Fe0.97Mn0.03O3/Zn0.5Ni0.5Fe2O4 bilayered thin films by tunable schottky barrier and interface barrier

机译:通过可调谐肖特基屏障和界面屏障,增强Bi0.92HO0.08F20.97MN0.03O3 / ZN0.5NI0.5FE2O4的双层薄膜

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The Bi(0.92-x)Ho(0.08)A(x)Fe(0.97)Mn(0.03)O(3)/Zn0.5Ni0.5Fe2O4 (BHAFMO/ZNFO, A = Ca, Sr and Ba) bilayered thin films were deposited on FTO/glass substrates by using the chemical solution deposition method. The structure, leakage current and multiferroic properties were investigated. The results indicate that the increase of oxygen vacancies in the BHAFMO/ZNFO films lead to the increase of Schottky barrier, which is beneficial to the bulk limiting conduction mechanism ( Ohmic and space-charge-limited-conduction (SCLC)). But the increase of Schottky barrier also leads to the polarization relaxation of BHAFMO/ZNFO films, and domain switching is more difficult. These indicate that the concentration and migration of oxygen vacancies can be controlled by ions doped BHFMO/ZNFO films with different ionic radii. Adjustment of the interface barrier and Schottky barrier by controlling the oxygen vacancies could not only change the conduction mechanism, but also adjust the ferroelectric domain switching to influence ferroelectric polarization. Because the structure is close to the morphotropic phase boundary (MPB), the substitutional ionic radius is larger than that of Bi3+, and the concentration of oxygen vacancies is low, so the BHSrFMO/ZNFO film exhibits excellent ferroelectric properties (the remnant polarization (P-r) = 82.1 mu C/cm(2) and the coercive field (E-c) = 566 kV/cm). (C) 2018 Elsevier B.V. All rights reserved.
机译:铋(0.92-x)的豪(0.08)A(x)的铁(0.97)的Mn(0.03)O(3)/Zn0.5Ni0.5Fe2O4(BHAFMO / ZNFO,A = Ca,Sr和Ba)的双层薄膜是通过使用化学溶液沉积方法沉积在FTO /玻璃基板。的结构,泄漏电流和多重铁性进行了研究。结果表明,在BHAFMO / ZNFO膜的氧空位的增加导致肖特基势垒的增加,这对散装限制传导机制(欧姆和空间电荷限制电导(SCLC))是有益的。但是肖特基势垒的增加也导致BHAFMO / ZNFO膜的极化松弛,和域交换是比较困难的。这些都表明氧空位的浓度和迁移可以通过离子掺杂BHFMO / ZNFO膜具有不同离子半径来控制。界面屏障和肖特基势垒,通过控制氧空位不仅可以改变导通机构,而且还调整该铁电域交换以影响铁电体的极化的调节。由于结构是靠近型相界(MPB),替代的离子半径比是Bi 3+的大,并且氧空位的浓度低,所以BHSrFMO / ZNFO膜表现出优异的强介电特性(剩余极化(镨)= 82.1微米C /厘米(2)和矫顽电场Ec = 566千伏/厘米)。 (c)2018年elestvier b.v.保留所有权利。

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