首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >In Situ X-ray Photoelectron Spectroscopy Study of Lithium Interaction with Graphene and Nitrogen-Doped Graphene Films Produced by Chemical Vapor Deposition
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In Situ X-ray Photoelectron Spectroscopy Study of Lithium Interaction with Graphene and Nitrogen-Doped Graphene Films Produced by Chemical Vapor Deposition

机译:原位X射线光电子能谱与化学气相沉积产生的石墨烯和氮掺杂石墨烯薄膜的锂相互作用

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It is commonly accepted that the presence of nitrogen atoms in a graphene lattice improves many properties of carbon materials and particularly enhances their electrochemical capacity in Li ion batteries. Here, we present model experiments for revealing the difference in interaction of lithium with N-doped and N-free graphene samples by monitoring the changes in their electronic states after the deposition of Li vapors. Graphene and N-doped graphene films have been grown by chemical vapor deposition on copper substrates using methane and acetonitrile as precursors. The electronic structure of the films transferred onto SiO2/Si substrates was examined by X-ray photoelectron spectroscopy (XPS) before and after deposition of lithium from a Li evaporation source under vacuum conditions. A comparison between two graphene samples using in situ XPS measurements has detected a higher accumulation of lithium on the N-doped graphene, which implies its high prospects in energy storage applications. Analysis of the XPS core-level binding energy shifts showed that charge density donated by lithium is localized near the nitrogen defects, especially around the nitrogen atoms directly substituting for carbon atoms.
机译:通常接受石墨烯晶格中的氮原子的存在改善了碳材料的许多性质,特别提高了它们在Li离子电池中的电化学能力。这里,我们通过监测Li Vapors沉积后,揭示锂锂与N-掺杂的N-掺杂石墨烯样品的相互作用差异的模型实验。石墨烯和N掺杂的石墨烯薄膜已经通过使用甲烷和乙腈作为前体上的铜基底上的化学气相沉积。在真空条件下,通过X射线光电子能谱(XPS)检查转移到SiO 2 / Si底物上的膜的电子结构。使用原位XPS测量的两个石墨烯样品之间的比较检测到N掺杂石墨烯上的锂累积,这意味着其在储能应用中的高前景。 XPS核心级结合能量移位的分析表明,锂赋予锂掺杂的电荷密度在氮缺陷附近,尤其是直接置换碳原子的氮原子。

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