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Study of the Growth of Graphene Film on Ni and Si Substrates by Hot Filament Chemical Vapor Deposition

机译:用热丝化学气相沉积研究Ni和Si基材上石墨烯膜的生长研究

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Graphene films were prepared on Ni and heavily doped Si substrates simultaneously by hot filament chemical vapor deposition. Films were prepared at two sets of parameters: at 3 mbar process pressure, 600 °C substrate temperature and also at 2 mbar process pressure, 800 °C substrate temperature. Field emission scanning electron microscopy images show vertical growth of graphene films on Si substrates and planer growth on Ni substrates. Raman spectroscopy was used to study the phonon modes on the prepared films. The observed intensity ratio of I_D/I_G ~0.1 and I_G/I_(2D) ~2.5 in films grown on Ni substrate indicates the formation of more than 10-15 layers of defect free graphene films.
机译:通过热丝化学气相沉积同时在Ni和重掺杂的Si基板上制备石墨烯薄膜。在两组参数上制备薄膜:在3毫巴工艺压力下,600°C衬底温度,也在2毫巴工艺压力下,800°C衬底温度。场发射扫描电子显微镜图像显示石墨烯薄膜上的垂直生长,并在Ni衬底上进行平面生长。使用拉曼光谱学用于研究制备薄膜上的声子模式。在Ni衬底生长的薄膜中的I_D / I_G〜0.1和I_G / I_(2D)〜2.5的观察到的强度比表明形成了超过10-15层的缺陷的游离石墨烯膜。

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