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Comparative Study of Diamond Films Grown on Silicon Substrate Using Microwave Plasma Chemical Vapor Deposition and Hot-Filament Chemical Vapor Deposition Technique

机译:微波等离子体化学气相沉积和热丝化学气相沉积技术在硅衬底上生长金刚石薄膜的比较研究

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摘要

Diamond films on the p-type Si(111) and p-type(100) substrates were prepared by microwave plasma chemical vapor deposition (MWCVD) and hot-filament chemical vapor deposition (HFCVD) by using a mixture of methane CH_4 and hydrogen H_2 as gas feed. The structure and composition of the films have been investigated by X-ray Diffraction, Raman Spectroscopy and Scanning Electron Microscopy methods. A high quality diamond crystalline structure of the obtained films by using HFCVD method was confirmed by clear XRD-pattern. SEM images show that the prepared films are polycrystalline diamond films consisting of diamond single crystallites (111)-orientation perpendicular to the substrate. Diamond films grown on silicon substrates by using HFCVD show good quality diamond and fewer non-diamond components.
机译:通过使用甲烷CH_4和氢H_2的混合物通过微波等离子体化学气相沉积(MWCVD)和热丝化学气相沉积(HFCVD)在p型Si(111)和p型(100)衬底上制备金刚石膜作为气体饲料。通过X射线衍射,拉曼光谱和扫描电子显微镜法研究了膜的结构和组成。通过清晰的XRD图谱证实了使用HFCVD法获得的膜的高质量金刚石晶体结构。 SEM图像表明,所制备的膜是多晶金刚石膜,其由垂直于基材的金刚石单晶(111)取向组成。通过使用HFCVD在硅衬底上生长的金刚石膜显示出高质量的金刚石和更少的非金刚石成分。

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