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首页> 外文期刊>Sensors and Actuators, A. Physical >High-angular-sensitivity total-internal-reflection heterodyne interferometry for small displacement measurements
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High-angular-sensitivity total-internal-reflection heterodyne interferometry for small displacement measurements

机译:用于小位移测量的高角度敏感性全内反射外差干涉测量

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摘要

This paper proposes an optical method for measuring small displacements using high-angular-sensitivity total-internal-reflection (T1R) heterodyne interferometry. In the designed system, a half-wave plate and a quarter-wave plate that display specific optic-axis azimuths are combined to form a phase shifter. When an isosceles right-angle prism is placed between the phase shifter and an analyzer that displays suitable transmission-axis azimuth, it shifts and enhances the phase difference of the s- and p- polarization states at one TIR. The enhanced phase difference is a function of the prism incident angle, whose variation depends on the displacement of a target; therefore the displacement can be easily and precisely measured by estimating the phase-difference variation. The feasibility of our method was demonstrated with measurement resolution and sensitivity levels superior to 0.025 mu m and 4.0 degrees/mu m, respectively in a measurement range of 10 rim.(C) 2018 Elsevier B.V. All rights reserved.
机译:本文提出了一种使用高角度敏感性全内反射(T1R)外差干涉法测量小型位移的光学方法。在设计的系统中,组合半波片和显示特定光轴方位角的四分之一波片以形成相移器。当位于显示合适的透射轴方位角的移相器和分析器之间时,当沿右角度棱镜放置在相移器和分析仪之间时,它在一个TIR处移动并增强S-Z偏振态的相位差。增强的相位差是棱镜入射角的函数,其变化取决于目标的位移;因此,通过估计相位差变化,可以容易且精确地测量位移。我们的方法的可行性分别在10个RIM的测量范围内,测量分辨率和敏感水平优于0.025 mu m和4.0度/ mm m。(c)2018 Elsevier B.v.保留所有权利。

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