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首页> 外文期刊>Optik: Zeitschrift fur Licht- und Elektronenoptik: = Journal for Light-and Electronoptic >Reduction of efficiency droop in GaN/InGaN based multiple quantum well light emitting diode by varying Si-doping and thickness in barrier layers
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Reduction of efficiency droop in GaN/InGaN based multiple quantum well light emitting diode by varying Si-doping and thickness in barrier layers

机译:基于GaN / IngaN的多量子阱发光二极管效率下垂的效率下垂通过不同的Si掺杂和厚度在阻挡层中

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摘要

In this paper, InGaN/GaN based multiple quantum well blue light emitting diodes have been optimized by varying Si doping concentrations and incorporating step-wise graded thickness in quantum barriers for achieving improved internal quantum efficiency. Optimized Si-doped barrier profile along with graded thickness in quantum barriers shows improved performance of light emitting diodes. The improvement in results may be attributed to the fact that grading made the transportation of holes more homogeneous, which inhibits the electron leakage and enhances the radiative recombination.
机译:本文通过改变Si掺杂浓度并在量子屏障中结合阶梯式级厚度来优化基于Ingan / GaN的多量子阱蓝色发光二极管,以实现改善的内部量子效率。 优化的Si掺杂屏障型材以及量子屏障中的分级厚度显示出发光二极管的改善性能。 结果的改善可能归因于分级使得孔的运输更加均匀,这抑制了电子泄漏并增强了辐射重组。

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