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首页> 外文期刊>Optics Letters >On-chip colloidal quantum dot devices with a CMOS compatible architecture for near-infrared light sensing
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On-chip colloidal quantum dot devices with a CMOS compatible architecture for near-infrared light sensing

机译:片上胶体量子点器件,具有CMOS兼容架构,可用于近红外光敏

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摘要

Solution-processed semiconductors that exhibit tunable light absorption and can be directly integrated into state-of-the-art silicon technologies are attractive for near-infrared (NIR) light detection in applications of medical imaging, night vision cameras, hyperspectral sensing, etc. Colloidal quantum dot (CQD) is regarded as a promising candidate for its solution-processability and superior optoelectronic properties. Here we propose an on-chip CQD photodetector, photodiode-oxide-semiconductor field-effect transistor, for NIR light sensing. This CMOS compatible device architecture utilizes silicon as a channel for carrier transport and PbS CQD as the light absorbing material controlling the channel conductivity. While the light with a wavelength longer than about 1100 nm cannot excite a photocurrent in commercial silicon-based photodetectors due to the absorption cutoff of silicon, the proposed photo-detector can have responses owing to the usage of a PbS CQD photodiode. Simulations showed that the photodiode could provide photovoltage to the semiconductor, firming an inversion layer at the oxide-semiconductor interface, and the electron density at the interface is significantly enhanced. As a result, currents could flow through this layer with ease between the source and drain electrodes. For a proof-of-concept demonstration, we experimentally connected a CQD photodiode with a commercial silicon transistor and proved that the current from the transistor could be increased by photovoltage provided by the photodiode under NIR light illumination. The device shows a responsivity of 5.9A/W at the wavelength of 1250 nm. (C) 2019 Optical Society of America
机译:表现出可调谐的光吸收,并且可以直接集成到国家的最先进的硅技术溶液加工的半导体是用于医学成像,夜视摄像机,高光谱感测等的应用近红外(NIR)光检测吸引力胶体量子点(CQD)被认为是其溶液加工性和优异的光电特性有希望的候选。这里我们提出了一种片上CQD光电检测器,光电二极管氧化物半导体场效应晶体管,用于NIR光感测。此CMOS兼容设备架构利用硅作为载流子传输和PBS CQD作为光吸收材料控制沟道导电性的信道。而具有波长大于约1100nm的不能激发在商业的基于硅的光电检测器的光电流不再由于硅的吸收截止的光,所提出的光检测器可以具有由于一个的PbS CQD光电二极管的使用的响应。模拟表明,该光电二极管可以向半导体提供光电压,在氧化物 - 半导体界面紧肤反转层,和在界面处的电子密度显著增强。其结果是,电流可通过该层与源电极和漏电极之间流动容易性。用于验证的概念的示范,我们通过实验连接的光电二极管CQD用市售硅晶体管,并证明了从晶体管的电流可以增加由下NIR光照射光电二极管提供光电压。该器件示出了在1250纳米波长5.9A / W的响应。 (c)2019年光学学会

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  • 来源
    《Optics Letters》 |2019年第2期|共4页
  • 作者单位

    Univ Alberta Dept Elect &

    Comp Engn Edmonton AB T6G 2V4 Canada;

    Univ Alberta Dept Elect &

    Comp Engn Edmonton AB T6G 2V4 Canada;

    Univ Alberta Dept Elect &

    Comp Engn Edmonton AB T6G 2V4 Canada;

    Univ Alberta Dept Elect &

    Comp Engn Edmonton AB T6G 2V4 Canada;

    Univ Alberta Dept Elect &

    Comp Engn Edmonton AB T6G 2V4 Canada;

    Univ Alberta Dept Elect &

    Comp Engn Edmonton AB T6G 2V4 Canada;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 计量学;光学;
  • 关键词

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