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Redistribution of native defects and photoconductivity in ZnO under pressure

机译:压力下ZnO的天然缺陷和光电导性的再分配

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摘要

Control and design of native defects in semiconductors are extremely important for industrial applications. Here, we investigated the effect of external hydrostatic pressure on the redistribution of native defects and their impact on structural phase transitions and photoconductivity in ZnO. We investigated morphologically distinct rod- (ZnO-R) and flower-like (ZnO-F) ZnO microstructures where the latter contains several native defects namely, oxygen vacancies, zinc interstitials and oxygen interstitials. Synchrotron X-ray diffraction reveals pressure-induced irreversible phase transformation of ZnO-F with the emergence of a hexagonal metallic Zn phase due to enhanced diffusion of interstitial Zn during decompression. In contrast, ZnO-R undergoes a reversible structural phase transition displaying a large hysteresis during decompression. We evidenced that the pressure-induced strain and inhomogeneous distribution of defects play crucial roles at structural phase transition. Raman spectroscopy and emission studies further confirm that the recovered ZnO-R appears less defective than ZnO-F. It resulted in lower photocurrent gain and slower photoresponse during time-dependent transient photoresponse with the synergistic application of pressure and illumination (ultra-violet). While successive pressure treatments improved the photoconductivity in ZnO-R, ZnO-F failed to recover even its ambient photoresponse. Pressure-induced redistribution of native defects and the optoelectronic response in ZnO might provide new opportunities in promising semiconductors.
机译:对天然缺陷的控制和设计对于工业应用非常重要。在这里,我们研究了外部静水压力对天然缺陷的再分配的影响及其对ZnO中结构相转变和光电导的影响。我们研究了形态学上的不同的杆(ZnO-R)和花样(ZnO-F)ZnO微结构,其中后者包含几种天然缺陷,即氧空位,锌间质性和氧气间质。同步X射线衍射揭示了ZnO-F的压力诱导的不可逆相转化,由于在减压期间增强间质Zn扩散而产生的六边形金属Zn相。相反,ZnO-R经历了在减压期间显示大滞后的可逆结构相转变。我们证明了压力诱导的菌株和缺陷的不均匀分布在结构相转变时起着至关重要的作用。拉曼光谱和排放研究进一步证实回收的ZnO-R比ZnO-F的缺陷效果较少。在时间依赖性瞬态光响应期间导致较低的光电流增益和光响应较慢,具有压力和照明(紫外线)的协同应用。虽然连续的压力处理改善了ZnO-R中的光电导,但ZnO-F未能恢复甚至其环境光响应。压力引起的天然缺陷的重新分布和ZnO中的光电响应可能在有前途的半导体中提供新的机会。

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  • 来源
    《RSC Advances》 |2019年第8期|共11页
  • 作者单位

    Yonsei Univ Dept Earth Syst Sci Seoul 120749 South Korea;

    Ctr High Pressure Sci &

    Technol Adv Res Shanghai Peoples R China;

    Ctr High Pressure Sci &

    Technol Adv Res Shanghai Peoples R China;

    Hanyang Univ Dept Phys Seoul 133791 South Korea;

    Univ South Carolina Nano Ctr Columbia SC 29208 USA;

    CSIR Cent Glass &

    Ceram Res Inst Sensor &

    Actuator Div Kolkata 700032 India;

    Yonsei Univ Dept Earth Syst Sci Seoul 120749 South Korea;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 化学;
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