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P-doped diamond grown on (110)-textured microcrystalline diamond: growth,characterization and devices

机译:在(110)织构微晶金刚石上生长的P掺杂金刚石:生长,表征和装置

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The formation and properties of (110)-textured P-doped microcrystalline CVD diamond were studied. Based on several microscopy techniques, with a special emphasis on electron backscattered diffraction, a detailed determination of the grain orientations with respect to the exact [110] axis is given. The different orientations present in the film, in combination with low phosphine concentrations in the gas phase, lead to a variation in P incorporation that can vary over three orders of magnitude, as determined with cathodoluminescence mapping. The role of the surface morphology in the observation of these large incorporation differences is explained. Hall measurements confirm that the films are n-type conductive with a thermal activation energy of 0.56 eV. Based on B-doped substrates, pn junctions were created, showing a rectification ratio of nearly 10~4 at ± 25 V.
机译:研究了(110)织构的P掺杂微晶CVD金刚石的形成和性能。基于几种显微镜技术,特别着重于电子反向散射衍射,给出了相对于确切的[110]轴的晶粒取向的详细确定。薄膜中存在的不同取向,加上气相中的低磷化氢浓度,会导致P掺入量的变化,该变化可以在三个数量级上变化,这是通过阴极发光映射确定的。解释了表面形态在观察这些较大掺入差异中的作用。霍尔测量证实该膜为n型导电性,热活化能为0.56 eV。基于掺杂B的衬底,创建了pn结,在±25 V时显示出接近10〜4的整流比。

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