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EPR and Optical Studies on as Grown Polycrystalline Diamond and Diamond Films Annealed between 1100 and 1900 K

机译:退火至1100 K和1900 K之间的成膜多晶金刚石和金刚石薄膜的EPR和光学研究

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We report a systematic study by electron paramagnetic resonance (EPR), and infrared absorption of as grown and annealed free standing polycrystalline diamond films. In all CVD diamond films studied an EPR resonance is observed at g=2.0028(2). Comparison of the local and bulk concentrations indicated that these centres are inhomogeneously distributed in the films, wher as the single substitutional nitrogen centres appear homogeneously distributed throughout the CVD diamond. The strength of the total EPR absorption at g=2.0028 correlates with the total infrared absorption in the CH region. Upon annealing to 1900 K in vacuum the intensity of the resonance at g=2.0028 decreases significantly in intensity and narrows slightly. During this treatment the sharp infrared absorption line at 2820 cm~(-1) increased and then decreased in intensity, but besides this there were no significant changes in the infrared absorption. The results suggest that the dangling bonds responsible for the g=2.0028 EPR absorption are not located in the diamond lattice but are to be found on grain boundaries or in non-diamond intergranular material and are compensated during annealing when hydrogen on the grain boundaries, or in intergranular material becomes mobile. New unidentified EPR centres are produced when the samples are annealed in vacuum above 1800 K.
机译:我们通过电子顺磁共振(EPR)和成长和退火的独立多晶金刚石薄膜的红外吸收报告了系统的研究。在所有研究的CVD金刚石薄膜中,在g = 2.0028(2)处观察到EPR共振。局部和整体浓度的比较表明,这些中心在薄膜中不均匀分布,而单个取代氮中心在整个CVD金刚石中似乎均匀分布。在g = 2.0028处的总EPR吸收的强度与在CH区域中的总红外吸收相关。在真空中退火到1900 K后,在g = 2.0028处的共振强度强度显着降低,并略有变窄。在此处理过程中,在2820 cm〜(-1)处清晰的红外吸收线先增大后减小,但除此之外,红外吸收没有明显变化。结果表明,负责g = 2.0028 EPR吸收的悬空键不在金刚石晶格中,而是存在于晶界或非金刚石晶界材料中,并且在退火过程中,当晶界上存在氢时,补偿了该悬挂键;或者在颗粒间的物质变得可移动。当样品在1800 K以上的真空中退火时,会产生新的EPR中心。

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