Electronic structure of the 1D conductor K0.3MoO3 studied using resonant inelastic X-ray scattering and soft X-ray emission spectroscopy

摘要

The electronic structure of the quasi-one-dimensional conductor K0.3MoO3 has been measured using high resolution resonant inelastic x-ray scattering and x-ray absorption spectroscopy. The results are compared to those for the related two-dimensional insulator alpha-MoO3. Features of the scattering from both oxides are observed and are explained in terms of the band momentum selectivity of the scattering process, allowing a comparison of the scattering data with recent band structure calculations.