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AlGaN/GaN multiple quantum wells grown on facet-controlled epitaxial lateral overgrown GaN/sapphire templates

机译:在面受控外延横向生长的GaN /蓝宝石模板上生长的AlGaN / GaN多量子阱

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摘要

Epitaxial lateral overgrowth of GaN with (11 (2) over bar2) facets was realized by metal organic chemical vapour deposition on GaN/ sapphire (0001) substrates with an SiO2 stripe mask. After wet etching of the mask, periodic AlGaN/ GaN multiple quantum wells (MQWs) were grown on the whole surface. Cross section transmission electron microscopy showed that the average growth rate on the (11 (2) over bar2) facet is lower than on the (0001) plane. The concentration of Al of AlGaN/GaN MQWs was higher on the (0001) facet than on the (11 (2) over bar2) surface, as measured by secondary ion mass spectrometry and high resolution x- ray diffraction (HR-XRD). Micro- Raman scattering spectroscopy revealed a significant relaxation of compressive stress in the laterally overgrown GaN. Micro- photoluminescence spectra confirmed quantum confinement of electrons in MQWs. The achieved optical quality of MQWs on the (11 (2) over bar2) facet is comparable with that on the (0001) plane.
机译:通过在带有SiO2条纹掩模的GaN /蓝宝石(0001)衬底上进行金属有机化学气相沉积,可以实现在(bar2)面上具有(11(2))面的GaN的外延横向过生长。在对掩模进行湿法刻蚀之后,周期性的AlGaN / GaN多量子阱(MQW)在整个表面上生长。横截面透射电子显微镜显示,在(bar2)上方(11(2))面上的平均生长速率低于(0001)面上的平均生长速率。通过二次离子质谱法和高分辨率X射线衍射(HR-XRD)测量,在(0001)面上的AlGaN / GaN MQWs中的Al浓度高于在(bar2上方的(11(2))面上)。显微拉曼散射光谱显示横向过度生长的GaN中压缩应力显着松弛。微光致发光光谱证实了MQWs中电子的量子限制。在bar2上的(11(2)面上)上实现的MQW的光学质量与(0001)面上的质量相当。

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