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首页> 外文期刊>Journal of Physics, D. Applied Physics: A Europhysics Journal >Measuring magnetisation reversal in micron-sized Nd2Fe14B single crystals by microbeam x-ray magnetic circular dichroism
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Measuring magnetisation reversal in micron-sized Nd2Fe14B single crystals by microbeam x-ray magnetic circular dichroism

机译:通过微束X射线磁性圆二色性测量微米级Nd2Fe14B单晶中的磁化反转

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摘要

Magnetisation reversal of micron-sized Nd2Fe14B single crystals with magnetisation as weak as 10(-9) emu (1 mu m size) was studied. Single-crystal specimens (cylinders with diameter and height of 1 to 6 mu m) were prepared by focused-ion beam so that both the magnetic easy and hard axes were included in the basal plane. Their magnetic hysteresis loops were measured when they were rotated with respect to the cylindrical axis by using microbeam hard-x-ray magnetic circular dichroism (XMCD) under transmission geometry. It was found that coercivity is inversely proportional to the cosine of the angle between the magnetocrystalline easy axis and magnetic-field direction and that the magnetisation reversal is dominated by domain-wall pinning in two different modes. One is related to penetration of the reversed domain nucleated in a subsurface soft layer into the bulk hard phase, of which the hysteresis loops exhibit a single-stage abrupt jump in magnetization. The other mode is pinning of the walls within the bulk grain, of which the hysteresis loops exhibit a plateau. The multi-domain structure associated with the pinning was confirmed by XMCD mapping. The proposed method fills the gap between conventional bulk magnetic measurement and submicron-scale electrical-transport measurement for nanofabricated thin films and/or fine particles. It is expected to provide new insights into elemental magnetisation processes in micron-scale regions.
机译:研究了微米级Nd2Fe14B单晶的磁化反转,其磁化强度弱至10(-9)emu(1微米)。通过聚焦离子束制备单晶试样(直径和高度为1至6μm的圆柱体),以使磁易轴和硬轴都包含在基面中。当在透射几何条件下使用微束硬X射线磁性圆二色性(XMCD)相对于圆柱轴旋转时,测量了它们的磁滞回线。已经发现,矫顽力与磁晶易轴和磁场方向之间的夹角成反比,并且磁化反转主要由畴壁钉扎以两种不同的方式进行。一个涉及到在地下软层中形核的反向磁畴渗透到整体硬质相中,其磁滞回线在磁化过程中表现出单级突变。另一种模式是钉扎在散装颗粒内的壁,其中的磁滞回线呈现出平稳状态。通过XMCD映射确认了与固定关联的多域结构。所提出的方法填补了传统的体磁测量与亚微米级电传输测量之间的差距,用于纳米加工的薄膜和/或细颗粒。有望为微米级区域的元素磁化过程提供新的见解。

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