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首页> 外文期刊>Journal of nanoscience and nanotechnology >Influence of Pt-Fe2O3 Core-Shell Nanoparticles on the Metal Filament Formation in Active Metal/Pt-Fe2O3 Core-Shell-Embedded ZnO/Pt Resistive Switching Memory Device
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Influence of Pt-Fe2O3 Core-Shell Nanoparticles on the Metal Filament Formation in Active Metal/Pt-Fe2O3 Core-Shell-Embedded ZnO/Pt Resistive Switching Memory Device

机译:Pt-Fe2O3核壳纳米粒子对活性金属/ Pt-Fe2O3核壳嵌入ZnO / Pt电阻开关存储器件中金属丝形成的影响

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We have embedded a layer of self-assembled Pt-Fe2O3 core-shell nanoparticles in the ZnO layers of active metal/ZnO/Pt device structures, and the effects of the nanoparticle layer on the resistive switching properties of the devices have been studied. We chose active metals, such as Cu and Ag, as the top electrode because of the well-known resistive switching mechanism based on metal filament formation. All the fabricated devices exhibit bipolar switching characteristics regardless of the existence of Pt-Fe2O3 core-shell nanoparticle layer. However, while the devices without the nanoparticle layer show unstable resistive switching characteristics due to randomly formed metal filaments, the devices with the nanoparticle layer are more stable, with lower values of the forming and set voltages. This operational stability and reduction in the values of the forming and set voltages of the devices with the nanoparticle layer can be attributed to the pinning effect of the nanoparticles on the metal filaments. Our results indicate that incorporation of a layer of Pt-Fe(2)O3 core-shell nanoparticles in the ZnO thin film enhances the resistive switching properties of the ZnO switching layer in active metal/ZnO/Pt resistive switching memory devices.
机译:我们在活性金属/ ZnO / Pt器件结构的ZnO层中嵌入了一层自组装的Pt-Fe2O3核-壳纳米颗粒,并研究了纳米颗粒层对器件电阻转换特性的影响。由于众所周知的基于金属细丝形成的电阻切换机制,我们选择活性金属(例如Cu和Ag)作为顶部电极。无论是否存在Pt-Fe2O3核-壳纳米颗粒层,所有制造的器件均显示出双极开关特性。然而,尽管由于随机形成的金属细丝而没有纳米颗粒层的器件表现出不稳定的电阻开关特性,但是具有纳米颗粒层的器件更稳定,具有较低的成形电压和设定电压。具有纳米颗粒层的装置的这种操作稳定性和形成电压和设定电压值的降低可归因于纳米颗粒在金属丝上的钉扎效应。我们的结果表明,在ZnO薄膜中掺入一层Pt-Fe(2)O3核-壳纳米粒子可以增强活性金属/ ZnO / Pt电阻式开关存储器件中ZnO开关层的电阻开关性能。

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