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首页> 外文期刊>Journal of Materials Science >A 2D percolation-based model for characterizing the piezoresistivity of carbon nanotube-based films
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A 2D percolation-based model for characterizing the piezoresistivity of carbon nanotube-based films

机译:基于二维渗流的模型,用于表征碳纳米管基薄膜的压阻

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Carbon nanotubes (CNTs) have attracted considerable attention due to their unique electrical, mechanical, and electromechanical properties. In particular, thin films formed by embedding CNTs in polymer matrices have been shown to exhibit strain-sensitive electromechanical properties, which can serve as an alternative to traditional strain sensors. Although numerous experimental studies have characterized their electrical properties and piezoresistivity, it remains unclear as to what nano-scale mechanisms dominate to govern nanocomposite electromechanical properties. Therefore, the objective of this study is to create a two-dimensional (2D) percolation-based numerical model to understand the electrical and coupled electromechanical behavior of CNT-based thin films. First, a percolation-based model with randomly dispersed straight nanotubes was generated. Second, the percolation and unstrained electrical properties of the model were evaluated as a function of CNT density and length. Next, uniaxial tensile-compressive strains were applied to the model for characterizing their electromechanical response and piezoresistivity. In addition, the effects of different intrinsic strain sensitivities of individual nanotubes were also considered. The results showed that bulk film strain sensitivity was strongly related to CNT density, length, and its intrinsic strain sensitivity. In particular, it was found that strain sensitivity decreased with increasing CNT density. While these strain sensitivity trends were consistent for different intrinsic CNT gage factors, the results were more complicated near the percolation threshold. These results were also compared to other experimental research so as to understand how different nano-scale parameters propagate and affect bulk film response.
机译:碳纳米管(CNTs)由于其独特的电气,机械和机电性能而受到了广泛的关注。特别是,通过将CNT嵌入聚合物基体中形成的薄膜已显示出对应变敏感的机电性能,可以替代传统的应变传感器。尽管许多实验研究已经表征了它们的电性能和压阻,但对于控制纳米复合机电性能的纳米尺度机理仍不清楚。因此,本研究的目的是创建一个基于二维(2D)渗流的数值模型,以了解基于CNT的薄膜的电和耦合机电行为。首先,生成具有随机分散的直纳米管的基于渗流的模型。其次,将模型的渗透和非应变电性能评估为CNT密度和长度的函数。接下来,将单轴拉伸压缩应变应用于模型,以表征其机电响应和压阻。另外,还考虑了各个纳米管的不同固有应变敏感性的影响。结果表明,体膜应变敏感性与CNT的密度,长度及其固有应变敏感性密切相关。特别地,发现应变敏感性随着CNT密度的增加而降低。尽管这些应变敏感性趋势对于不同的固有CNT应变因子是一致的,但在渗透阈值附近,结果更为复杂。这些结果也与其他实验研究进行了比较,以了解不同的纳米级参数如何传播和影响体膜响应。

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