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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >The crystal and electronic band structure of the diamond-like semiconductor Ag_2ZnSiS_4
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The crystal and electronic band structure of the diamond-like semiconductor Ag_2ZnSiS_4

机译:类金刚石半导体Ag_2ZnSiS_4的晶体和电子能带结构

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Single crystals of the new diamond-like semiconductor Ag_2ZnSiS_4 have been synthesized using high-temperature, solid state synthesis at 800 °C. The compound crystallizes in the monoclinic, non-centrosymmetric space group Pn with o = 6.4052(1)A, b = 6.5484(1) A, c=7.9340(l)A,β = 90.455(1)° and R1 (for all data) = 2.42%. The electronic band structure and density of states were calculated using density functional theory (DFT) and the full potential linearized augmented plane wave (LAPW) method within the Wien2k program suite. The calculated band structure suggests that Ag_2ZnSiS_4 is a direct band gap semiconductor with a calculated band gap of 1.88 eV at the T-point. The calculated density of states of Ag_2ZnSiS_4 is compared with that of AgGaS_2. The band gap of Ag_2ZnSiS_4 was also determined experimentally as 3.28 eV via optical diffuse reflectance spectroscopy.
机译:新型的类金刚石半导体Ag_2ZnSiS_4的单晶已经在800°C的高温下进行了固态合成。该化合物在单斜,非中心对称空间群Pn中结晶,其中o = 6.4052(1)A,b = 6.5484(1)A,c = 7.9340(l)A,β= 90.455(1)°,R1(对于所有数据)= 2.42%。使用Wien2k程序套件中的密度泛函理论(DFT)和全势线性化增强平面波(LAPW)方法计算电子能带结构和状态密度。计算出的能带结构表明,Ag_2ZnSiS_4是一种直接带隙半导体,在T点处的带隙为1.88 eV。将计算出的Ag_2ZnSiS_4的态密度与AgGaS_2的态密度进行比较。 Ag_2ZnSiS_4的带隙也通过光学漫反射光谱法通过实验确定为3.28 eV。

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