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首页> 外文期刊>Dalton transactions: An international journal of inorganic chemistry >Charge-displacement analysis as a tool to study chalcogen bonded adducts and predict their association constants in solution
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Charge-displacement analysis as a tool to study chalcogen bonded adducts and predict their association constants in solution

机译:电荷位移分析是研究硫族键合加合物并预测其在溶液中的缔合常数的工具

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摘要

The secondary interaction between a polarized chalcogen atom and different Lewis bases, either anionic or neutral, has been studied by charge displacement analysis. Using charge displacement analysis, the charge rearrangement in the adduct upon the formation of the interaction has been quantified and described in great detail. By comparing the theoretical results with the experimental association constants, two linear correlations can be found for anionic and neutral bases. Such correlations can be used to reliably predict the association constants of adducts for which experimental data are not available yet.
机译:极化硫族元素原子与不同的路易斯碱(阴离子或中性)之间的次级相互作用已通过电荷位移分析进行了研究。使用电荷位移分析,已量化并详细描述了相互作用形成后加合物中的电荷重排。通过将理论结果与实验缔合常数进行比较,可以发现阴离子和中性碱的两个线性相关性。这种相关性可用于可靠地预测尚无实验数据的加合物的缔合常数。

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