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The effect of Si alloying on the thermal stability of Al_2O_3 films deposited by filtered cathodic arc

机译:Si合金化对阴极滤波电弧沉积Al_2O_3薄膜热稳定性的影响

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摘要

The effect of Si alloying on the phase transformation sequence and phase formation temperatures of Al_2O_3 thin films deposited by filtered cathodic arc was investigated by annealing experiments in air. By addition of Si the transformation of γ- to δ- and θ-Al_2O_3 is restrained by 100 °C. The thermal stability range of the δ- and θ-phase is also increased by ≥200 °C with respect to the unalloyed Al_2O_3 thin film and the formation of α-Al_2O_3 is restrained by 200 °C upon addition of Si. Based on the observed Si addition induced changes in phase formation, crystallite size and bonding it appears reasonable that the presence of SiO_2 at the grain boundaries impedingmass transport governs the Si induced stability enhancement of the metastable γ-/δ- and θ-Al_2O_3 phases and the restrained α-Al_2O_3 formation. The competing proposal assuming a randomsubstitution of Al by Si on the lattice sites is not consistent with the XPS data.
机译:通过在空气中进行退火实验,研究了Si合金化对经过滤阴极电弧沉积的Al_2O_3薄膜的相变顺序和相形成温度的影响。通过添加Si,可以将γ-转变为δ-和θ-Al_2O_3的温度限制在100°C。相对于未合金化的Al_2O_3薄膜,δ相和θ相的热稳定性范围也增加了≥200°C,并且在添加Si后,α-Al_2O_3的形成受到200°C的限制。根据观察到的硅添加引起的相形成,晶粒尺寸和键合变化,似乎合理的是,在晶界处SiO_2的存在阻碍了质量迁移,从而控制了硅诱导的亚稳γ-/δ-和θ-Al_2O_3相的稳定性增强,并且受约束的α-Al_2O_3的形成。假设硅在晶格位点上随机取代Al的竞争提议与XPS数据不一致。

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