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Implementation of density functional embedding theory within the projector-augmented-wave method and applications to semiconductor defect states

机译:投影机增强波方法中密度泛函嵌入理论的实现及其在半导体缺陷状态中的应用

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We report a new implementation of the density functional embedding theory (DFET) in the VASP code, using the projector-augmented-wave (PAW) formalism. Newly developed algorithms allow us to efficiently perform optimized effective potential optimizations within PAW. The new algorithm generates robust and physically correct embedding potentials, as we verified using several test systems including a covalently bound molecule, a metal surface, and bulk semiconductors. We show that with the resulting embedding potential, embedded cluster models can reproduce the electronic structure of point defects in bulk semiconductors, thereby demonstrating the validity of DFET in semiconductors for the first time. Compared to our previous version, the new implementation of DFET within VASP affords use of all features of VASP (e.g., a systematic PAW library, a wide selection of functionals, a more flexible choice of U correction formalisms, and faster computational speed) with DFET. Furthermore, our results are fairly robust with respect to both plane-wave and Gaussian type orbital basis sets in the embedded cluster calculations. This suggests that the density functional embedding method is potentially an accurate and efficient way to study properties of isolated defects in semiconductors. (C) 2015 AIP Publishing LLC.
机译:我们使用投影仪增强波(PAW)形式主义报告了VASP代码中密度功能嵌入理论(DFET)的新实现。最新开发的算法使我们能够在PAW内高效执行优化的有效电势优化。正如我们使用包括共价键结合的分子,金属表面和体半导体的几个测试系统所验证的那样,新算法产生了坚固且物理上正确的嵌入电势。我们表明,利用产生的嵌入潜力,嵌入式簇模型可以重现体半导体中点缺陷的电子结构,从而首次证明DFET在半导体中的有效性。与我们以前的版本相比,VASP中DFET的新实现提供了DFET使用VASP的所有功能(例如,系统的PAW库,广泛的功能选择,更灵活的U校正形式选择以及更快的计算速度) 。此外,对于嵌入式聚类计算中的平面波和高斯型轨道基集,我们的结果是相当可靠的。这表明密度泛函嵌入方法可能是研究半导体中隔离缺陷的特性的准确而有效的方法。 (C)2015 AIP Publishing LLC。

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