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首页> 外文期刊>Physical Review, B. Condensed Matter >Conduction mechanism in ultrathin metallic films - art. no. 045412
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Conduction mechanism in ultrathin metallic films - art. no. 045412

机译:超薄金属膜的导电机理-艺术没有。 045412

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摘要

The conduction mechanism in ultrathin films may differ from bulk materials due to different effects: surface scattering and quantum size effect should be considered. Also weak localization and superconductivity may be important. All those effects are detected with the magnetoconductance. Therefore epitaxial Pb films have been grown on Si(111) 7 x 7 in ultrahigh vacuum at low temperatures. With conductance and magnetoconductance in situ those contributions are separated. Due to detailed structural informations from spot profile analysis of low-energy electron diffraction the effect of film disorder and surface roughness is revealed for all scattering processes. [References: 26]
机译:由于影响不同,超薄膜中的传导机制可能与块状材料不同:应考虑表面散射和量子尺寸效应。弱的局部性和超导性也可能很重要。所有这些影响都可以通过磁导检测到。因此,在低温下,Si(111)7 x 7上已在超高真空下生长了外延Pb膜。通过电导和磁导原位,这些贡献被分离。由于来自低能电子衍射斑点轮廓分析的详细结构信息,揭示了所有散射过程的薄膜无序和表面粗糙度的影响。 [参考:26]

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