首页> 外文期刊>Physical Review, B. Condensed Matter >Experimental and theoretical studies of diamond nucleation on silicon by biased hot filament chemical vapor deposition - art. no. 085412
【24h】

Experimental and theoretical studies of diamond nucleation on silicon by biased hot filament chemical vapor deposition - art. no. 085412

机译:偏置热丝化学气相沉积法在硅上金刚石成核的实验和理论研究-艺术。没有。 085412

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

Diamond nucleation by biased hot filament chemical vapor deposition was investigated by scanning electron microscopy and atomic force microscopy. it was found that a number of microdefects were produced on a substrate surface owing to energetic ion bombardment under negative substrate bias, which increased with increasing negative bias. The nucleation density was enhanced with an increase of negative bias. During diamond nucleation, a purple glow was observed when the negative bias was increased to a critical value. At the onset of glow discharge, the process of diamond nucleation on a silicon surface by biased hot filament chemical vapor deposition was theoretically studied by analysis of the experimental results of diamond nucleation. The relationship among the number of active ions, the microdefects, and nucleation density with negative bias was given by reasonable analytic formulas. The effect of negative bias on ion diffusion on the substrate surface was theoretically researched and deduced. The influence of negative bias on the bond strength of diamond nuclei on the substrate was analyzed theoretically. The adhesion force between diamond nuclei and the substrate surface was measured by means of the scratch surface method, which was in accord with theoretical consideration. The results indicated that the theoretical calculation was in agreement with experimental results. [References: 56]
机译:通过扫描电子显微镜和原子力显微镜研究了通过偏置热丝化学气相沉积形成的金刚石核。已经发现,由于在负衬底偏压下的高能离子轰击,在衬底表面上产生了许多微缺陷,该缺陷随负偏压的增加而增加。随着负偏压的增加,成核密度增加。在金刚石成核过程中,当负偏压增加到临界值时,会观察到紫色光芒。在辉光放电开始时,通过分析金刚石成核的实验结果,从理论上研究了通过偏置热丝化学气相沉积在硅表面形成金刚石的过程。通过合理的解析公式,给出了活性离子数,微缺陷与成核密度与负偏压之间的关系。从理论上研究和推导了负偏压对离子在基片表面扩散的影响。从理论上分析了负偏压对金刚石核与基体结合强度的影响。通过刮擦表面法测量金刚石核与基底表面之间的粘附力,这与理论考虑相符。结果表明理论计算与实验结果吻合。 [参考:56]

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号