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Perturbation analysis on large band gap bowing of dilute nitride semiconductors

机译:稀氮化物半导体大带隙弯曲的扰动分析

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Contrary to the conventional empirical law, band gap of the dilute nitride semiconductors decreases with increasing nitrogen concentration. In spite of a number of investigations, the origin of this "large band gap bowing" is still under debate. In order to elucidate this phenomenon, we investigate change of the band edge energy of GaNxAs1-x due to nitrogen by using the perturbation theory. We found that energy shift of the conduction band edge is arising from intervalley mixing between the Gamma- and L-states and/or Gamma- and X-states mainly induced by displacement of Ga atoms around nitrogen. The valence band edge state shows upward shift in spite of negative potential of nitrogen. These results are well understood from symmetry of the wavefunctions and the perturbation potential. (C) 2016 Elsevier B.V. All rights reserved.
机译:与传统的经验定律相反,稀氮化物半导体的带隙随着氮浓度的增加而减小。尽管进行了许多调查,但这种“大带隙弯曲”的起源仍在争论中。为了阐明这种现象,我们使用微扰理论研究了氮引起的GaNxAs1-x的带边能量变化。我们发现,导带边的能量移动是由伽马和L态和/或伽马和X态之间的间隔混合引起的,该混合主要是由Ga原子在氮周围的位移引起的。尽管氮的负电势,价带边缘态仍显示出向上移动。从波函数和微扰势的对称性可以很好地理解这些结果。 (C)2016 Elsevier B.V.保留所有权利。

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